IEC 61337-1:2004
Current
The latest, up-to-date edition.
Filters using waveguide type dielectric resonators - Part 1: Generic specification
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, English - French, Spanish, Castilian
02-11-2004
IEC 61337-1:2004 applies to filters using waveguide type dielectric resonators of assessed quality using either capability approval or qualification approval procedures. It also lists the test and measurement procedures which may be selected for use in detail specifications for such filters.
Committee |
TC 49
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DevelopmentNote |
Supersedes IEC 61337-1-1 and IEC 61337-1-2. (11/2004) A Bilingual edition has been published on 06/08/2013. (08/2013) Stability Date: 2017. (09/2017)
|
DocumentType |
Standard
|
Pages |
24
|
PublisherName |
International Electrotechnical Committee
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Status |
Current
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Supersedes |
Standards | Relationship |
NEN EN IEC 61337-1 : 2005 | Identical |
I.S. EN 61337-1:2005 | Identical |
PN EN 61337-1 : 2009 | Identical |
UNE-EN 61337-1:2004 | Identical |
BS EN 61337-1:2004 | Identical |
CEI EN 61337-1 : 2005 | Identical |
EN 61337-1:2004 | Identical |
NF EN 61337-1 : 2005 | Identical |
DIN EN 61337-1:2005-07 | Identical |
DD IEC/TS 61994-2:2011 | Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric and dielectric filters |
IEC TS 61994-2:2011 | Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters |
09/30200793 DC : 0 | BS EN 61994-2 ED.2 - PIEZOELECTRIC AND DIELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION - GLOSSARY - PART 2: PIEZOELECTRIC AND DIELECTRIC FILTERS |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60068-2-58:2015+AMD1:2017 CSV | Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
IEC 60068-2-20:2008 | Environmental testing - Part 2-20: Tests - Test T: Test methods for solderability and resistance to soldering heat of devices with leads |
IECQ 001002-3:2005 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES |
IEC 60068-2-21:2006 | Environmental testing - Part 2-21: Tests - Test U: Robustness of terminations and integral mounting devices |
IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
Q C 001005 : 1995 | REGISTER OF FIRMS, PRODUCTS AND SERVICES APPROVED UNDER THE IECQ SYSTEM, INCLUDING ISO 900 |
IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
IEC 60050-561:2014 | International Electrotechnical Vocabulary (IEV) - Part 561: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |
IEC 60068-2-29:1987 | Environmental testing. Part 2: Tests. Test Eb and guidance: Bump |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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