IEC 61788-16:2013
Current
The latest, up-to-date edition.
Superconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
16-01-2013
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty of the test method
8 Test report
Annex A (informative) - Additional information
relating to Clauses 1 to 7
Annex B (informative) - Uncertainty considerations
Bibliography
IEC 61788-16:2013 involves describing the standard measurement method of power-dependent surface resistance of superconductors at microwave frequencies by the sapphire resonator method. The measuring item is the power dependence of Rs at the resonant frequency. This method is the applicable for a frequency in the range of 10 GHz, for an input microwave power lower than 37 dBm (5 W). The aim is to report the surface resistance data at the measured frequency and that scaled to 10 GHz. Keyword: superconductivity
| Committee |
TC 90
|
| DevelopmentNote |
Stability date: 2020. (01/2013)
|
| DocumentType |
Standard
|
| Pages |
62
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 61788-16 : 2013 | Identical |
| NEN EN IEC 61788-16 : 2013 | Identical |
| PN EN 61788-16 : 2013 | Identical |
| DIN EN 61788-16 : 2013 | Identical |
| VDE 0390-16 : 2013 | Identical |
| BS EN 61788-16:2013 | Identical |
| CEI EN 61788-16 : 2013 | Identical |
| EN 61788-16:2013 | Identical |
| SN EN 61788-16:2013 | Identical |
| PNE-FprEN 61788-16 | Identical |
| UNE-EN 61788-16:2013 | Identical |
| IEC 61788-15:2011 | Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies |
| IEC 61788-7:2006 | Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies |
| ISO/IEC Guide 99:2007 | International vocabulary of metrology Basic and general concepts and associated terms (VIM) |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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