Superconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies

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Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

16-01-2013

Publisher

International Electrotechnical Committee

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
6 Measurement procedure
7 Uncertainty of the test method
8 Test report
Annex A (informative) - Additional information
relating to Clauses 1 to 7
Annex B (informative) - Uncertainty considerations
Bibliography

IEC 61788-16:2013 involves describing the standard measurement method of power-dependent surface resistance of superconductors at microwave frequencies by the sapphire resonator method. The measuring item is the power dependence of Rs at the resonant frequency. This method is the applicable for a frequency in the range of 10 GHz, for an input microwave power lower than 37 dBm (5 W). The aim is to report the surface resistance data at the measured frequency and that scaled to 10 GHz. Keyword: superconductivity

Committee	TC 90
DevelopmentNote	Stability date: 2020. (01/2013)
DocumentType	Standard
Pages	62
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
NF EN 61788-16 : 2013	Identical
NEN EN IEC 61788-16 : 2013	Identical
PN EN 61788-16 : 2013	Identical
DIN EN 61788-16 : 2013	Identical
VDE 0390-16 : 2013	Identical
BS EN 61788-16:2013	Identical
CEI EN 61788-16 : 2013	Identical
EN 61788-16:2013	Identical
SN EN 61788-16:2013	Identical
PNE-FprEN 61788-16	Identical
UNE-EN 61788-16:2013	Identical

IEC 61788-15:2011	Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
IEC 61788-7:2006	Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
ISO/IEC Guide 99:2007	International vocabulary of metrology Basic and general concepts and associated terms (VIM)
ISO/IEC Guide 98-3:2008	Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

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IEC 61788-16:2013

Superconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies

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