IEC 61788-7:2006

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Apparatus
  5.1 Measurement system
  5.2 Measurement apparatus for R[s]
  5.3 Dielectric rods
6 Measurement procedure
  6.1 Specimen preparation
  6.2 Set-up
  6.3 Measurement of reference level
  6.4 Measurement of the frequency response of resonators
  6.5 Determination of surface resistance of the
      superconductor and epsilon and tan delta of the
      standard sapphire rods
7 Precision and accuracy of the test method
  7.1 Surface resistance
  7.2 Temperature
  7.3 Specimen and holder support structure
  7.4 Specimen protection
8 Test report
  8.1 Identification of test specimen
  8.2 Report of R[s] values
  8.3 Report of test conditions
Annex A (informative) Additional information
        relating to Clauses 1 to 8
Bibliography

IEC 61788-7:2006 describes measurement of the surface resistance of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of surface resistances for this method is as follows:



- Frequency: 8 GHz < f < 30 GHz



- Measurement resolution: 0,01 milliohm at 10 GHz.