IEC 62047-5:2011
Current
The latest, up-to-date edition.
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
13-07-2011
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Essential ratings and characteristics
5 Measuring methods
6 Reliability (performance)
Annex A (informative) - General description of RF MEMS
Switches
Annex B (informative) - Geometry of RF MEMS switches
Annex C (informative) - Packaging of RF MEMS switches
Annex D (informative) - Failure mechanism of RF MEMS switches
Annex E (informative) - Applications of RF MEMS switches
Annex F (informative) - Measurement procedure of RF MEMS
switches
IEC 62047-5:2011 describes terminology, definition, symbols, test methods that can be used to evaluate and determine the essential ratings and characteristic parameters of RF MEMS switches. The statements made in this standardization are also applicable to RF (Radio Frequency) MEMS (Micro-Electro-Mechanical Systems) switches with various structures, contacts (d.c. contact and capacitive contact), configurations (series and shunt), switching networks (SPST, SPDT, DPDT, etc.), and actuation mechanism such as electrostatic, electro-thermal, electromagnetic, piezoelectric, etc. The RF MEMS switches are promising devices in advanced mobile phones with multi-band/mode operation, smart radar systems, reconfigurable RF devices and systems, SDR (Software Defined Radio) phones, test equipments, tunable devices and systems, satellite, etc. The contents of the corrigendum of March 2012 have been included in this copy.
| DevelopmentNote |
Stability Date: 2018. (09/2017)
|
| DocumentType |
Standard
|
| Pages |
69
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 62047-5 : 2012 | Identical |
| NBN EN 62047-5 : 2011 | Identical |
| NEN EN IEC 62047-5 : 2011 | Identical |
| I.S. EN 62047-5:2011 | Identical |
| PN EN 62047-5 : 2012 | Identical |
| UNE-EN 62047-5:2011 | Identical |
| BS EN 62047-5:2011 | Identical |
| CEI EN 62047-5 : 2015 | Identical |
| EN 62047-5:2011 | Identical |
| DIN EN 62047-5:2012-03 | Identical |
| PNE-FprEN 62047-5 | Identical |
| 14/30296894 DC : 0 | BS EN 62830-1 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR DEVICES FOR ENERGY HARVESTING AND GENERATION - PART 1: VIBRATION BASED PIEZOELECTRIC ENERGY HARVESTING |
| BS IEC 62830-3 : 2017 | SEMICONDUCTOR DEVICES - SEMICONDUCTOR DEVICES FOR ENERGY HARVESTING AND GENERATION - PART 3: VIBRATION BASED ELECTROMAGNETIC ENERGY HARVESTING |
| IEC 62830-3:2017 | Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting |
| 17/30336994 DC : 0 | BS IEC 62969-3 ED.1.0 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR INTERFACE FOR AUTOMOTIVE VEHICLES - PART 3: SHOCK DRIVEN PIEZOELECTRIC ENERGY HARVESTING FOR AUTOMOTIVE VEHICLE SENSORS |
| 14/30301992 DC : 0 | BS EN 62830-3 - SEMICONDUCTOR DEVICES - SEMICONDUCTOR DEVICES FOR ENERGY HARVESTING AND GENERATION - PART 3: VIBRATION BASED ELECTROMAGNETIC ENERGY HARVESTING |
| IEC 62830-1:2017 | Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting |
| IEC 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
| IEC 60749-27:2006+AMD1:2012 CSV | Semiconductor devices - Mechanical and climatic test methods - Part27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) |
| IEC 60747-16-4:2004+AMD1:2009+AMD2:2017 CSV | Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 CSV | Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers |
| IEC 60749-10:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock |
| IEC 60749-12:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency |
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