IEC 62396-1:2016 RLV
Current
The latest, up-to-date edition.
Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
19-01-2016
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Abbreviations and acronyms
5 Radiation environment of the atmosphere
6 Effects of atmospheric radiation on avionics
7 Guidance for system designs
8 Determination of avionics single event effects rates
9 Considerations for SEE compliance
Annex A (informative) - Thermal neutron assessment
Annex B (informative) - Methods for calculating SEE
rates in avionics electronics
Annex C (informative) - Review of test facility availability
Annex D (informative) - Tabular description of variation
of atmospheric neutron flux with altitude and latitude
Annex E (informative) - Consideration of effects at higher
altitudes
Annex F (informative) - Prediction of SEE rates for ions
Annex G (informative) - Late news as of 2014 on SEE
cross-sections applicable to the atmospheric neutron
environment
Annex H (informative) - Calculating SEE rates from
non-white (non-atmospheric like) neutron
cross-sections for small geometry electronic
components
Bibliography
IEC 62396-1:2016 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.
IEC 62396-1:2016(E) provides guidance on atmospheric radiation effects on avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). It defines the radiation environment, the effects of that environment on electronics and provides design considerations for the accommodation of those effects within avionics systems. This International Standard helps aerospace equipment manufacturers and designers to standardise their approach to single event effects in avionics by providing guidance, leading to a standard methodology. This edition includes the following significant technical changes with respect to the previous edition:
- incorporation of references to some new papers and issues which have appeared since 2011;
- addition of solar flares and extreme space weather reference to a proposed future Part 6;
- addition of reference to a proposed new Part 7 on incorporating atmospheric radiation effects analysis into the system design process;
- addition of a reference to a proposed future Part 8 on other particles including protons, pions and muons.
Committee |
TC 107
|
DevelopmentNote |
Stability date: 2018. (01/2016)
|
DocumentType |
Redline
|
Pages |
215
|
PublisherName |
International Electrotechnical Committee
|
Status |
Current
|
Supersedes |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
SAE ARP 4754 : 2010 | GUIDELINES FOR DEVELOPMENT OF CIVIL AIRCRAFT AND SYSTEMS |
MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
IEC TS 62239-1:2015 | Process management for avionics - Management plan - Part 1: Preparation and maintenance of an electronic components management plan |
SAE ARP 4761 : 1996 | GUIDELINES AND METHODS FOR CONDUCTION THE SAFETY ASSESSMENT PROCESS ON CIVIL AIRBORNE SYSTEMS AND EQUIPMENT |
IEC 62396-4:2013 | Process management for avionics - Atmospheric radiation effects - Part 4: Design of high voltage aircraft electronics managing potential single event effects |
FAA AC 23.1309-1 : 2011 | SYSTEM SAFETY ANALYSIS AND ASSESSMENT FOR PART 23 AIRPLANES |
IEC 62396-5:2014 | Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems |
IEC 62396-3:2013 | Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation |
FAA AC 25.1309-1 : 0 | SYSTEM DESIGN AND ANALYSIS |
MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
EIA 4899 : 2001 | STANDARD FOR PREPARING AN ELECTRONIC COMPONENTS MANAGEMENT PLAN |
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