IEC 62562:2010
Current
The latest, up-to-date edition.
Cavity resonator method to measure the complex permittivity of low-loss dielectric plates
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, English - French
18-02-2010
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FOREWORD
1 Scope
2 Measurement parameters
3 Theory and calculation equations
4 Measurement equipment and apparatus
5 Measurement procedure
Annex A (informative) - Example of measured result
and accuracy
Bibliography
IEC 62562:2010 describes a measurement method of dielectric properties in the planar direction of dielectric plate at microwave frequency, called a cavity resonator method. It has been created in order to develop new materials and to design microwave active and passive devices for which standardization of measurement methods of material properties is more and more important. This first edition cancels and replaces the PAS published in 2008. This bilingual version, published in 2010-05, corresponds to the English version.
This publication contains colours which are considered to be useful for the correct understanding of its contents.
| Committee |
TC 46/SC 46F
|
| DevelopmentNote |
Supersedes IEC PAS 62562. (02/2010) Stability Date: 2018. (10/2012)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| GOST R IEC 62562 : 2012 | Identical |
| NF EN 62562 : 2011 | Identical |
| NBN EN 62562 : 2011 | Identical |
| NEN EN IEC 62562 : 2011 | Identical |
| I.S. EN 62562:2011 | Identical |
| PN EN 62562 : 2011 | Identical |
| UNE-EN 62562:2011 | Identical |
| BS EN 62562:2011 | Identical |
| CEI EN 62562 : 2011 | Identical |
| EN 62562:2011 | Identical |
| DIN EN 62562:2011-10 | Identical |
| PNE-EN 62562 | Identical |
| 13/30282586 DC : 0 | BS EN 61338-1-5 - WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5:GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY |
| I.S. EN 61338-1-5:2015 | WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY |
| IEC 61338-1-5:2015 | Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency |
| EN 61338-1-5:2015 | Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency |
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