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IEC
IEC 62562:2010

IEC 62562:2010

Current

Current

The latest, up-to-date edition.

Cavity resonator method to measure the complex permittivity of low-loss dielectric plates

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English, English - French

Published date

18-02-2010

Publisher

International Electrotechnical Committee

FOREWORD
1 Scope
2 Measurement parameters
3 Theory and calculation equations
4 Measurement equipment and apparatus
5 Measurement procedure
Annex A (informative) - Example of measured result
        and accuracy
Bibliography

IEC 62562:2010 describes a measurement method of dielectric properties in the planar direction of dielectric plate at microwave frequency, called a cavity resonator method. It has been created in order to develop new materials and to design microwave active and passive devices for which standardization of measurement methods of material properties is more and more important. This first edition cancels and replaces the PAS published in 2008. This bilingual version, published in 2010-05, corresponds to the English version.

This publication contains colours which are considered to be useful for the correct understanding of its contents.

Committee
TC 46/SC 46F
DevelopmentNote
Supersedes IEC PAS 62562. (02/2010) Stability Date: 2018. (10/2012)
DocumentType
Standard
Pages
20
PublisherName
International Electrotechnical Committee
Status
Current
Supersedes

Standards Relationship
GOST R IEC 62562 : 2012 Identical
NF EN 62562 : 2011 Identical
NBN EN 62562 : 2011 Identical
NEN EN IEC 62562 : 2011 Identical
I.S. EN 62562:2011 Identical
PN EN 62562 : 2011 Identical
UNE-EN 62562:2011 Identical
BS EN 62562:2011 Identical
CEI EN 62562 : 2011 Identical
EN 62562:2011 Identical
DIN EN 62562:2011-10 Identical

13/30282586 DC : 0 BS EN 61338-1-5 - WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5:GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY
I.S. EN 61338-1-5:2015 WAVEGUIDE TYPE DIELECTRIC RESONATORS - PART 1-5: GENERAL INFORMATION AND TEST CONDITIONS - MEASUREMENT METHOD OF CONDUCTIVITY AT INTERFACE BETWEEN CONDUCTOR LAYER AND DIELECTRIC SUBSTRATE AT MICROWAVE FREQUENCY
IEC 61338-1-5:2015 Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
EN 61338-1-5:2015 Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

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Hardcopy - English
PDF - English
PDF 3 Users - English
PDF 5 Users - English
PDF 9 Users - English
Hardcopy - English - French
PDF - English - French
PDF 3 Users - English - French
PDF 5 Users - English - French
PDF 9 Users - English - French
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