IEC 62595-1-1:2013
Current
The latest, up-to-date edition.
LCD backlight unit - Part 1-1: Generic specification
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
09-04-2013
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FOREWORD
1 Scope
2 Normative references
3 Technical aspects
4 Quality assessment procedures
5 Test and measurement procedures
Annex A (informative) - Examples of BLU drawings
Annex B (informative) - Lot tolerance percentage
defective (LTPD) sampling plans
IEC 62595-1-1:2013 is a generic specification for backlight unit (BLU) for liquid crystal displays. It defines general procedures for quality assessment and gives general rules for the measuring methods of electrical and optical characteristics, rules for climatic and mechanical tests, and rules for endurance tests.
| DevelopmentNote |
Stability date: 2017. (04/2013)
|
| DocumentType |
Standard
|
| Pages |
46
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 62595-1-1 : 2013 | Identical |
| NEN EN IEC 62595-1-1 : 2013 | Identical |
| PN EN 62595-1-1 : 2014 | Identical |
| BS EN 62595-1-1:2013 | Identical |
| CEI EN 62595-1-1 : 2014 | Identical |
| EN 62595-1-1:2013 | Identical |
| DIN EN 62595-1-1:2015-01 | Identical |
| UNE-EN 62595-1-1:2013 | Identical |
| PNE-FprEN 62595-1-1 | Identical |
| DEFSTAN 08-107/3(2013) : 2013 | GENERAL REQUIREMENTS FOR THE DESIGN OF ELECTROTECHNICAL AND NAVAL WEAPON EQUIPMENT |
| IEC 61747-10-2:2014 | Liquid crystal display devices - Part 10-2: Environmental, endurance and mechanical test methods - Environmental and endurance |
| IECQ 001002-3:2005 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 3: APPROVAL PROCEDURES |
| IECQ 001002-2:1998 | IEC QUALITY ASSESSMENT SYSTEM FOR ELECTRONIC COMPONENTS (IECQ) - RULES OF PROCEDURE - PART 2: DOCUMENTATION |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| IEC 62595-2:2012 | LCD backlight unit - Part 2: Electro-optical measurement methods of LED backlight unit |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
| ISO 80000-1:2009 | Quantities and units — Part 1: General |
| IEC 62595-1-2:2016 | Display lighting unit - Part 1-2: Terminology and letter symbols |
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