Test methods for measurement of electrical properties of carbon nanotubes

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

04-08-2009

Publisher

International Electrotechnical Committee

Foreword
IEEE Introduction
1 Overview
  1.1 Scope
  1.2 Purpose
  1.3 Electrical characterization overview
2 Definitions, acronyms, and abbreviations
  2.1 Definitions
  2.2 Acronyms and abbreviations
3 Nanotube properties
  3.1 Single-walled nanotube
  3.2 Multi-walled nanotube
4 Electrodes
  4.1 Materials
  4.2 Method for electrode fabrication
  4.3 Dimensions
5 Device characterization
  5.1 Architecture design
  5.2 Method for processing and fabrication
  5.3 Standard characterization procedures
  5.4 Environmental control and standards
Annex A (informative) Bibliography
Annex B (informative) List of Participants

IEC 62624:2009(E) (IEEE 1650:2005) provides methods for the electrical characterization of carbon nanotubes (CNTs). The methods will be independent of processing routes used to fabricate the CNTs.

Committee	TC 113
DevelopmentNote	Also numbered as IEEE 1650. (08/2009) Stability Date: 2017. (12/2017)
DocumentType	Standard
Pages	17
PublisherName	International Electrotechnical Committee
Status	Current

Standards	Relationship
DIN IEC 62624:2010-10	Identical
GOST R IEC 62624 : 2013	Identical
NEN IEC 62624 : 2009	Identical

IEC/IEEE 62659:2015	Nanomanufacturing - Large scale manufacturing for nanoelectronics
PD IEC/TS 62607-2-1:2012	Nanomanufacturing. Key control characteristics Carbon nanotube materials. Film resistance
IEC TS 62607-2-1:2012	Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance
IEC PAS 62565-2-1:2011	Nanomanufacturing - Material specifications - Part 2-1: Single-wall carbon nanotubes - Blank detail specification

SEMI E89 : 2007(R2013)

GUIDE FOR MEASUREMENT SYSTEM ANALYSIS (MSA)

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IEC 62624:2009

Test methods for measurement of electrical properties of carbon nanotubes

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Abstract

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