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IEC 62884-2:2017

Current

Current

The latest, up-to-date edition.

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French, English

Published date

30-08-2017

€155.95
Excluding VAT

IEC 62884-2:2017 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

Committee
TC 49
DocumentType
Standard
Pages
48
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
NF EN 62884-2:2017 Identical
BS EN 62884-2:2017 Identical
UNE-EN 62884-2:2017 Identical

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