IEC 63287-1:2021
Current
The latest, up-to-date edition.
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English - French
25-08-2021
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IEC 63287-1:2021 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.
NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.
NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
This first edition of IEC 63287-1 cancels and replaces the first edition of IEC 60749-43 published in 2017. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
the document has been renamed and renumbered to distinguish it from the IEC 60749 (all parts);
a new section concerning the concept of "family" has been added with appropriate renumbering of the existing text.
| DocumentType |
Standard
|
| Pages |
86
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| EN IEC 63287-1:2021 | Identical |
| I.S. EN IEC 63287-1:2021 | Identical |
| SS-EN IEC 63287-1, UTG 1:2022 | Identical |
| CEI EN IEC 63287-1:2022 | Identical |
| PN-EN IEC 63287-1:2022-05 | Identical |
| BS EN IEC 63287-1:2021 | Identical |
| OVE EN IEC 63287-1:2023 10 01 | Identical |
| UNE-EN IEC 63287-1:2021 | Identical |
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