IEC PAS 61076-3-110:2002
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Connectors for electronic equipment - Part 3-110: Detail specification for 8 way connectors for frequencies up to 600 MHz
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
07-12-2007
English
29-01-2002
FOREWORD
1 Scope
1.1 Normative references
2 IEC type designation
2.1 Terminology
2.2 Marking
2.3 Main functions
2.4 Interchangeability
2.4.1 Intermateability
2.4.2 Interoperability
2.4.2.1 General
2.4.2.2 Requirements
3 Common features and isometric view
3.1 Isometric view
3.2 Mating information
3.2.1 Contacts interface
3.2.2 Fixed connector contacts
3.2.3 Free connector contacts
4 Dimensions
4.1 General
4.2 Type C free connectors
4.2.1 Free connector, side protrusions dimensions
4.3 Terminations
5 Gauges
5.1 Fixed connectors
5.2 Free connectors
5.3 Switch actuator gauges
6 Characteristics
6.1 General
6.2 Classification into climatic categories
6.3 Creepage and clearance distance
6.4 Electrical characteristics
6.4.1 Voltage proof
6.4.2 Current-carrying capacity
6.4.3 Initial contact resistance
6.4.4 Input to output resistance
6.4.5 Input to output resistance unbalance
6.4.6 Initial insulation resistance
6.5 Transmission characteristics, category
6.5.1 Insertion loss
6.5.2 Return loss
6.5.3 Propagation delay
6.5.4 Delay skew
6.5.5 NEXT loss
6.5.6 FEXT loss
6.5.7 Longitudinal conversion loss
6.5.8 Coupling attenuation
6.5.9 Transfer impedance
6.6 Mechanical characteristics
6.6.1 Mechanical operation including switch
6.6.2 Effectiveness of connector coupling devices
6.6.3 Insertion and withdrawal forces
7 Tests and test schedule
7.1 General
7.2 Test procedures and measuring methods
7.3 Preconditioning
7.4 Wiring and mounting of specimens
7.4.1 Wiring
7.4.2 Mounting
7.4.3 Arrangement for contact resistance
measurement
7.4.4 Test procedure
7.4.5 Arrangement for dynamic stress tests (test
phases AP6, AP7)
7.5 Test schedules
7.5.1 Basic (minimum) test schedule
7.5.2 Full test schedule
7.5.2.1 Test group P preliminary
7.5.2.2 Test group AP
7.5.2.3 Test group BP
7.5.2.4 Test group CP
7.5.2.5 Test group DP
7.5.2.6 Test group EP
7.5.2.7 Test group FP
Annex A (normative) Gauging requirements
Annex B (normative) Locking device mechanical operation -
test procedure and requirements
Annex C (normative) High frequency (category 7)
transmission interoperability testing
Annex D (normative) General requirements for the
measurement set-up
Annex E (normative) Insertion loss
Annex F (normative) Return loss
Annex G (normative) Near end cross talk
Annex H (normative) Far end cross talk
Annex I (normative) Longitudinal conversion loss
Annex J (normative) Transfer impedance
Annex K (normative) Coupling attenuation
Annex L (normative) Termination of balun
Annex M (normative) Gauge dimensions supplement for switch
actuator for use with standard IEC 61076-3-110
series connectors
Covers 8-way connectors up to 4 pairs to be used up to 600 MHz, when used with an appropriate cable. These cables are specified in IEC 61156. The connectors are compatible with those already defined in IEC 60603-7-7.
DocumentType |
Miscellaneous Product
|
Pages |
77
|
PublisherName |
International Electrotechnical Committee
|
Status |
Superseded
|
SupersededBy |
Standards | Relationship |
01/207165 DC : DRAFT OCT 2001 | Identical |
NEN NPR IEC/PAS 61076-3-110 : 2002 | Identical |
IEC 60603-7-1:2011 | Connectors for electronic equipment - Part 7-1: Detail specification for 8-way, shielded, free and fixed connectors |
IEC 61076-1:2006 | Connectors for electronic equipment - Product requirements - Part 1: Generic specification |
IEC 60352-3:1993 | Solderless connections - Part 3: Solderless accessible insulation displacement connections - General requirements, test methods and practical guidance |
IEC 60512-8:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 8: Connector tests (mechanical) and mechanical tests on contacts and terminations |
IEC 60352-6:1997 | Solderless connections - Part 6: Insulation piercing connections - General requirements, test methods and practical guidance |
IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
IEC 60512-6:1984 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 6: Climatic tests and soldering tests |
ISO/IEC 11801:2002 | Information technology Generic cabling for customer premises |
IEC 60512-7:1993 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 7: Mechanical operating tests and sealing tests |
IEC 60068-2-38:2009 | Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test |
ISO 1302:2002 | Geometrical Product Specifications (GPS) Indication of surface texture in technical product documentation |
IEC 60603-7:2008+AMD1:2011 CSV | Connectors for electronic equipment - Part 7: Detail specification for 8-way, unshielded, free and fixed connectors |
IEC 60512-4:1976 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 4: Dynamic stress tests |
IEC 60352-2:2006+AMD1:2013 CSV | Solderless connections - Part 2: Crimped connections - Generalrequirements, test methods and practical guidance |
IEC 60512-5:1992 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 5: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests |
IEC 60512-1:2001 | Connectors for electronic equipment - Tests and measurements - Part 1: General |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
IEC 60603-7-7:2010 | Connectors for electronic equipment - Part 7-7: Detail specification for 8-way, shielded, free and fixed connectors for data transmission with frequencies up to 600 MHz |
IEC 60512-3:1976 | Electromechanical components for electronic equipment; basic testing procedures and measuring methods. Part 3: Current-carrying capacity tests |
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