IEC PAS 62129:2004

FOREWORD
1 Scope
2 Normative references
3 Definitions
4 Calibration test requirements
  4.1 Preparation
  4.2 Reference test conditions
  4.3 Traceability
5 Resolution bandwidth (spectral resolution) test
  5.1 Overview
  5.2 Resolution bandwidth (spectral resolution) test
      5.2.1 Equipment for resolution bandwidth (spectral
            resolution) test
      5.2.2 Test procedure for resolution bandwidth
            (spectral resolution)
6 Displayed power level calibration
  6.1 Overview
  6.2 Displayed power level (DPL) calibration under
      reference conditions
      6.2.1 Equipment for DPL calibration under reference
            conditions
      6.2.2 Test procedure for DPL calibration under
            reference conditions
      6.2.3 Calculation of DPL uncertainty under reference
            conditions
  6.3 Displayed power level (DPL) calibration for operating
      conditions
      6.3.1 Wavelength dependence
      6.3.2 Polarization dependence
      6.3.3 Linearity
      6.3.4 Temperature dependence
  6.4 Calculation of expanded uncertainty in displayed
      power level
7 Wavelength calibration
  7.1 Overview
  7.2 Wavelength calibration under reference conditions
      7.2.1 Equipment for wavelength calibration under
            reference conditions
      7.2.2 Test procedure for wavelength calibration
            under reference conditions
      7.2.3 Calculations of wavelength uncertainty under
            reference conditions
  7.3 Wavelength calibration for operating conditions
      7.3.1 Wavelength dependence
      7.3.2 Temperature dependence
  7.4 Calculation of expanded uncertainty in wavelength
8 Documentation
  8.1 Measurement data and uncertainty
  8.2 Measurement conditions
Annex A (normative) Mathematical basis for calculation
        of calibration uncertainty
  A.1 Deviations
  A.2 Uncertainty type A
  A.3 Uncertainty type B
  A.4 Accumulation of uncertainties
  A.5 Reporting
Annex B (informative) Examples of calculation of
        calibration uncertainty
  B.1 Displayed power level calibration
      B.1.1 Uncertainty under reference conditions:
            sigma[delta Pref]
      B.1.2 Uncertainty under operating conditions
      B.1.3 Expanded uncertainty calculation
  B.2 Wavelength calibration
      B.2.1 Uncertainty under reference conditions:
            sigma[delta lambda ref]
      B.2.2 Uncertainty under operating conditions
      B.2.3 Expanded uncertainty calculation
Annex C (informative) Using the calibration results
  C.1 General
      C.1.1 Scope
      C.1.2 Parameters
      C.1.3 Restrictions
  C.2 Additive corrections
      C.2.1 Parameters
      C.2.2 Measurements close to a calibration reference
            wavelength
      C.2.3 Measurements at other wavelengths
  C.3 Multiplicative corrections
      C.3.1 Parameters
      C.3.2 Measurements close to a calibration reference
            wavelength
      C.3.3 Measurements at other wavelengths
  C.4 OSA calibration results (additive correction)
Annex D (informative) Wavelength references
  D.1 Gas laser lines
  D.2 Noble gas reference lines
  D.3 Molecular absorption lines
  D.4 Reference documents
Annex E (informative) Further reading and references for
        calibration of wavelength scale

Provides procedures for calibrating an optical spectrum analyzer designed to measure the power distribution of an optical spectrum; this analyzer is equiped with an input port for use with a fibre-optic connector. This document applies to optical spectrum analyzers developed for use in fibre-optic communications and is limited to equipment that can directly measure the optical spectrum output from an optical fibre, where the optical fibre is connected to an input port installed in the optical spectrum analyzer through a fibre-optic connector.