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IEC PAS 62277:2001

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Test-fixture of surface mounting quartz crystal units

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Superseded date

04-07-2003

Superseded by

IEC 60444-8:2016

Language(s)

English

Published date

28-08-2001

€41.59
Excluding VAT

1 Introduction
2 Scope
3 Application
4 General issue
5 Leadless surface mounting quartz crystal units
   5.1 Enclosure
   5.2 Overtone and frequency range
6 Specifications of measurement method, test-fixture
   6.1 Specifications of measurement method
   6.2 Specifications of test-fixture
7 Calibration of measurement system and C[L] adapter board
   7.1 Calibration of measurement system
   7.2 Calibration of C[L] adapter board
Reference

Describes the test-fixture that allows the accurate measurement of resonance frequency, resonance resistance, and electrical-equivalent-circuit constants of a leadless surface mounting quartz crystal using the zero phase technique as specified in IEC 60444.

DevelopmentNote
Also numbered as BS PD IEC/PAS 62277. (02/2002)
DocumentType
Miscellaneous Product
Pages
11
PublisherName
International Electrotechnical Committee
Status
Superseded
SupersededBy

Standards Relationship
NEN NPR IEC/PAS 62277 : 2001 Identical

IEC 60444-5:1995 Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
IEC TR 60444-4:1988 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
IEC 61240:2016 Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

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