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Accelerated Moisture Resistance - Unbiased HAST
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Available format(s): Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users
Superseded date: 09-03-2004
Language(s): English
Published date: 15-08-2002
Publisher: International Electrotechnical Committee
FOREWORD1 Purpose2 Scope3 Apparatus4 Test conditions5 Procedure6 Failure criteria7 Safety8 Summary
Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
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