IEC PAS 62396-2:2007
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
19-08-2008
English
18-09-2007
Important note : Users cannot be edited or removed once added to your Multi user PDF.
1 General
1.1 Use of existing SEE data
1.2 Deciding to perform dedicated SEE tests
2 Availability of existing SEE data for avionics
applications
2.1 Types of existing SEE data that may be used
2.1.1 Sources of data, proprietary versus published
data
2.1.2 Data based on the use of different sources
2.1.3 Ground level versus avionics applications
2.2 Sources of existing data
3 Considerations for SEE Testing
3.1 Selection of hardware to be tested
3.2 Selection of test method
3.3 Selection of facility providing energetic particles
3.3.1 Spallation neutron source
3.3.2 Monoenergetic and quasi-monoenergetic beam
sources
3.3.3 Thermal neutron sources
4 Converting test results to avionics SEE rates
4.1 Use of spallation neutron source
4.2 Use of SEU cross section curve over energy
Bibliography
Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
| Committee |
TC 107
|
| DocumentType |
Miscellaneous Product
|
| Pages |
23
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NEN NPR IEC/PAS 62396-2 : 2007 | Identical |
| DD IEC PAS 62396-2 : DRAFT DEC 2007 | Identical |
| IEC TS 62396-1:2006 | Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment |
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