IEC TR 63133:2017
Current
The latest, up-to-date edition.
Semiconductor devices - Scan based ageing level estimation for semiconductor devices
11-10-2017
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Ageing level
Bibliography
IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
| DevelopmentNote |
Stability Date: 2022. (10/2017)
|
| DocumentType |
Technical Report
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| PD IEC/TR 63133:2017 | Identical |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
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