IEC TS 62396-1:2006
Withdrawn
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Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
15-02-2019
English
08-03-2006
FOREWORD
INTRODUCTION
1 Scope and object
2 Normative references
3 Terms and definitions
4 Abbreviations used in the document
5 Radiation environment of the atmosphere
5.1 Radiation generation
5.2 Effect of secondary particles on avionics
5.3 Atmospheric neutrons
5.4 Secondary protons
5.5 Other particles
5.6 Solar enhancements
6 Effects of atmospheric radiation on avionics
6.1 Types of radiation effects
6.2 Single event effects
6.3 Total Ionising Dose (TID)
6.4 Displacement damage
7 Guidance for system designs
7.1 Overview
7.2 System design
7.3 Hardware considerations
7.4 Parts characterisation and control
8 Determination of avionics single event effects rates
8.1 Main single event effects
8.2 Single event effects with lower event rates
8.3 Single event effects with higher event rates -
Single event upset data
8.4 Calculating SEE rates in avionics
9 Considerations for SEE compliance
9.1 Compliance
9.2 Confirm the radiation environment for the avionics
application
9.3 Identify system development assurance level
9.4 Assess preliminary electronic equipment design for SEE
9.5 Verify that the system development assurance level
requirements are met for SEE
9.6 Corrective actions
Annex A (informative) Thermal neutron assessment
Annex B (informative) Methods of calculating SEE rates
in avionics electronics
Annex C (informative) Review of test facility availability
Annex D (informative) Tabular description of variation of
atmospheric neutron flux with altitude and latitude
Provides guidance on atmospheric radiation effects on avionics electronics used in aircraft operating at altitudes up to 60 000 feet (18,3 km). Defines the radiation environment, the effects of that environment on electronics and provides design considerations for the accommodation of those effects within avionics systems. Is intended to help aerospace equipment manufacturers and designers to standardise their approach to single event effects in avionics.
Committee |
TC 107
|
DocumentType |
Technical Specification
|
Pages |
58
|
PublisherName |
International Electrotechnical Committee
|
Status |
Withdrawn
|
SupersededBy |
Standards | Relationship |
DD IEC TS 62396-1 : DRAFT JUL 2006 | Identical |
NEN NPR IEC/TS 62396-1 : 2006 | Identical |
PKN IEC/TS 62396-1 : 2008 | Identical |
DD IEC/PAS 62396-4:2007 | Process management for avionics. Atmospheric radiation effects Guidelines for designing with high voltage aircraft electronics and potential single event effects |
DD IEC TS 62396-5 : DRAFT OCT 2008 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 5: GUIDELINES FOR ASSESSING THERMAL NEUTRON FLUXES AND EFFECTS IN AVIONICS SYSTEMS |
DD IEC PAS 62396-2 : DRAFT DEC 2007 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS |
DD IEC PAS 62396-3 : DRAFT DEC 2007 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 3: OPTIMISING SYSTEM DESIGN TO ACCOMMODATE THE SINGLE EVENT EFFECTS (SEE) OF ATMOSPHERIC RADIATION |
DD IEC TS 62564-1 : DRAFT SEP 2011 | PROCESS MANAGEMENT FOR AVIONICS - AEROSPACE QUALIFIED ELECTRONIC COMPONENTS (AQEC) - PART 1: INTEGRATED CIRCUITS AND DISCRETE SEMICONDUCTORS |
IEC PAS 62396-4:2007 | Process management for avionics - Atmospheric radiation effects - Part 4: Guidelines for designing with high voltage aircraft electronics and potential single event effects |
IEC TS 62396-2:2008 | Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems |
DD IEC TS 62396-3 : DRAFT OCT 2008 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 3: OPTIMISING SYSTEM DESIGN TO ACCOMMODATE THE SINGLE EVENT EFFECTS (SEE) OF ATMOSPHERIC RADIATION |
IEC TS 62396-3:2008 | Process management for avionics - Atmospheric radiation effects - Part 3: Optimising system design to accommodate the single event effects (SEE) of atmospheric radiation |
IEC PAS 62396-2:2007 | Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems |
IEC TS 62396-5:2008 | Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems |
IEC TS 62396-4:2008 | Process management for avionics - Atmospheric radiation effects - Part 4: Guidelines for designing with high voltage aircraft electronics and potential single event effects |
11/30256756 DC : 0 | BS EN 62396-2 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS |
DD IEC TS 62396-2 : DRAFT OCT 2008 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS |
DD IEC TS 62396-4 : DRAFT 2008 | PROCESS MANAGEMENT FOR AVIONICS ATMOSPHERIC RADIATION EFFECTS - PART 4: GUIDELINES FOR DESIGNING WITH HIGH VOLTAGE AIRCRAFT ELECTRONICS AND POTENTIAL SINGLE EVENT EFFECTS |
IEC PAS 62396-3:2007 | Process management for avionics - Atmospheric radiation effects - Part 3: Optimising system design to accommodate the Single Event Effects (SEE) of atmospheric radiation |
DD IEC PAS 62396-5 : DRAFT NOV 2007 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 5: GUIDELINES FOR ASSESSING THERMAL NEUTRON FLUXES AND EFFECTS IN AVIONICS SYSTEMS |
IEC PAS 62396-5:2007 | Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
SAE ARP 4754 : 2010 | GUIDELINES FOR DEVELOPMENT OF CIVIL AIRCRAFT AND SYSTEMS |
MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
IEC TS 62239:2008 | Process management for avionics - Preparation of an electronic components management plan |
SAE ARP 4761 : 1996 | GUIDELINES AND METHODS FOR CONDUCTION THE SAFETY ASSESSMENT PROCESS ON CIVIL AIRBORNE SYSTEMS AND EQUIPMENT |
FAA AC 23.1309-1 : 2011 | SYSTEM SAFETY ANALYSIS AND ASSESSMENT FOR PART 23 AIRPLANES |
FAA AC 25.1309-1 : 0 | SYSTEM DESIGN AND ANALYSIS |
MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
AIAA R 100 : A 2001 | RECOMMENDED PRACTICE FOR PARTS MANAGEMENT |
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