IEC TS 62396-5:2008
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems
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22-08-2014
English
19-08-2008
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Overview of thermal neutron single event rate calculation
5 Thermal neutron flux inside an airliner
5.1 Definition of thermal neutron
5.2 Overview
5.3 Background on aircraft measurements
5.4 Calculational approach
5.5 Processing of in-flight neutron flux data
6 Thermal neutron SEU cross sections
6.1 Overview of the issue
6.2 Mechanism involved
6.3 Thermal neutron SEU cross sections and Ratio-2
7 Recommendation for devices in avionics at present time
Bibliography
IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).
| DevelopmentNote |
Supersedes IEC PAS 62396-5. (08/2008) Stability Date: 2013. (10/2012)
|
| DocumentType |
Technical Specification
|
| Pages |
18
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| NEN NPR IEC/TS 62396-5 : 2008 | Identical |
| DD IEC TS 62396-5 : DRAFT OCT 2008 | Identical |
| 15/30324422 DC : 0 | BS EN 62396-1 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT |
| BS IEC 62396-1 : 2016 | PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT |
| 11/30256756 DC : 0 | BS EN 62396-2 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS |
| 14/30299002 DC : 0 | BS EN 60749-44 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES |
| 11/30246255 DC : 0 | BS EN 62396-1 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 1: ACCOMMODATION OF ATMOSPHERIC RADIATION EFFECTS VIA SINGLE EVENT EFFECTS WITHIN AVIONICS ELECTRONIC EQUIPMENT |
| PD IEC/PAS 62396-6:2014 | Process management for avionics. Atmospheric radiation effects Extreme space weather and potential impact on the avionics environment and electronics |
| IEC TS 62396-1:2006 | Process management for avionics - Atmospheric radiation effects - Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment |
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