IEEE 1149.7-2022
Current
Current
The latest, up-to-date edition.
IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
14-10-2022
The standard will define a link between IEEE 1149.1 interfaces in Debug and Test Systems (DTS) and IEEE 1149.1 (JTAG) interfaces in Target Systems (TS).
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