IEEE 1149.7-2022 REDLINE
Current
Current
The latest, up-to-date edition.
IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
14-10-2022
€436.50
Excluding VAT
The standard will define a link between IEEE 1149.1 interfaces in Debug and Test Systems (DTS) and IEEE 1149.1 (JTAG) interfaces in Target Systems (TS).
| Committee |
Test Technology
|
| DocumentType |
Standard
|
| ISBN |
978-1-5044-8875-4
|
| Pages |
1486
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Current
|
| Supersedes |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
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