IEEE DRAFT C62.45 : D2.1 SEP 2000
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
DRAFT RECOMMENDED PRACTICE ON SURGE TESTING FOR EQUIPMENT CONNECTED TO LOW-VOLTAGE AC POWER CIRCUITS
12-01-2013
11-04-2003
1 Overview
1.1 Scope
1.2 Purpose
2 References
3 Definitions
3.1 Technical terms
3.2 Special word usage
4 Planning of surge testing: Basic objective
4.1 General
4.2 Surge environment
4.3 Types of tests
4.4 Results and consequences of the test
4.5 Unpowered testing versus powered testing
4.6 Withstand levels
4.7 Voltage and current waveforms
4.8 Safety
5 Implementation of surge testing: Test equipment
5.1 General
5.2 Surge generators
5.3 Point of test surge application
5.4 Coupling the surge to the EUT
5.5 Monitoring the EUT
6 Performance of surge testing: Test procedures
6.1 General
6.2 Limiting stresses
6.3 Nature of the EUT
6.4 Safety
7 Applying the test surge: Coupling and decoupling
circuits
7.1 General
7.2 Requirements for surge coupling
7.3 Impedance considerations
7.4 Requirements for surge decoupling
7.5 Surge coupling
8 Grounding
8.1 Grounding for safety
8.2 Grounding practices in EUT
9 Standard surge tests waveforms
9.1 General
9.2 Standard waveforms
9.3 Test procedures
9.4 Equations for standard waveforms
10 Additional surge test waveforms
11 Evaluating test results
Annex A
Annex B
Describes the performance of surge testing on electrical and electronic equipment connected to low-voltage ac power circuits.
| DocumentType |
Draft
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Superseded
|
| IEEE 4-2013 | IEEE Standard for High-Voltage Testing Techniques |
| NFPA 70 : 2017 | NATIONAL ELECTRICAL CODE |