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IEEE/IEC 61671-5-2016
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IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
08-04-2016
This standard defines an exchange format, utilizing XML, for both the static description of a test adapter bydefining the interface between the UUT and the test station, and the specific description of test adapter instance information.
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