IEEE/IEC 61671-5-2016
Current
Current
The latest, up-to-date edition.
IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
08-04-2016
Important note : Users cannot be edited or removed once added to your Multi user PDF.This standard defines an exchange format, utilizing XML, for both the static description of a test adapter bydefining the interface between the UUT and the test station, and the specific description of test adapter instance information.
| Committee |
SCC20 - Test and Diagnosis for Electronic Sys
|
| DocumentType |
Standard
|
| ISBN |
978-1-5044-0866-0
|
| Pages |
32
|
| PublisherName |
Institute of Electrical & Electronics Engineers
|
| Status |
Current
|
| IEEE 1671-2010 | IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML |
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