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IEEE 1671-2010

IEEE 1671-2010

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

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withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

Available format(s)

PDF

Withdrawn date

25-03-2021

Language(s)

English

Published date

20-01-2011

Publisher

Institute of Electrical & Electronics Engineers

Committee
SCC20 - Test and Diagnosis for Electronic Sys
DocumentType
Standard
Pages
388
PublisherName
Institute of Electrical & Electronics Engineers
Status
Withdrawn
SupersededBy
Supersedes

IEEE/IEC 61671-5-2016 IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description
IEEE 1671.5-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
IEEE 1671.2-2012 IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description
IEEE 1871.2-2017 IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment
IEEE 1671.6-2015 REDLINE IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
IEEE 1871.1-2014 IEEE Recommended Practice for Using IEEE 1671.2(TM) Instrument Description Templates for Describing Synthetic Instrumentation for Classes of Instruments such as Waveform Generators, Digitizers, External Oscillators, and Up and Down Converters
IEEE 1671.4-2014 IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
IEEE 1636.1-2013 IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)
IEEE/IEC 61671-2-2016 IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description
IEEE 1636.99-2013 IEEE Std 1636.99-2013, IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Common Information Elements.
IEEE/IEC 61671-6-2016 IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description

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