Development Note
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Chinese translation of A2010 Edition issued in July 2013. (10/2013) |
Document Type
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Standard |
ISBN
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Pages
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Published
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Publisher
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Institute of Printed Circuits
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Status
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Superseded |
Superseded By
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IPC T 50 : M
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TERMS AND DEFINITIONS FOR INTERCONNECTING AND PACKAGING ELECTRONIC CIRCUITS |
IPC TM 650 : 0
|
TEST METHODS MANUAL |
ANSI/NCSL Z540 1 : 94(R2002)
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CALIBRATION - CALIBRATION LABORATORIES AND MEASURING AND TEST EQUIPMENT - GENERAL REQUIREMENTS |
ASTM D 2520 : 2013
|
Standard Test Methods for Complex Permittivity (Dielectric Constant) of Solid Electrical Insulating Materials at Microwave Frequencies and Temperatures to 1650oC |
ISO 10012-1:1992
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Quality assurance requirements for measuring equipment Part 1: Metrological confirmation system for measuring equipment |
IPC 9191 : 0
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GENERAL GUIDELINES FOR IMPLEMENTATION OF STATISTICAL PROCESS CONTROL (SPC) |
ASTM D 374 : 1999
|
Standard Test Methods for Thickness of Solid Electrical Insulation |
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