ISO 11952:2014
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
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Surface chemical analysis Scanning-probe microscopy Determination of geometric quantities using SPM: Calibration of measuring systems
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23-05-2019
English
12-05-2014
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ISO 11952:2014 specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use, where a lower level of calibration might be required.
| DevelopmentNote |
DRAFT ISO/DIS 11952 is also available for this standard. (10/2014)
|
| DocumentType |
Standard
|
| Pages |
58
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
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| SupersededBy |
| CAN/CSA-Z5100-17 | Cellulose nanomaterials - Test methods for characterization |
| 16/30300288 DC : 0 | BS ISO 19606 - FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - TEST METHOD FOR SURFACE ROUGHNESS OF FINE CERAMIC FILMS BY ATOMIC FORCE MICROSCOPY |
| PD ISO/TR 14187:2011 | Surface chemical analysis. Characterization of nanostructured materials |
| BS ISO 13095:2014 | Surface Chemical Analysis. Atomic force microscopy. Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement |
| ISO 13095:2014 | Surface Chemical Analysis Atomic force microscopy Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement |
| ISO/TR 19716:2016 | Nanotechnologies Characterization of cellulose nanocrystals |
| BS ISO 19606:2017 | Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for surface roughness of fine ceramic films by atomic force microscopy |
| PD ISO/TR 19716:2016 | Nanotechnologies. Characterization of cellulose nanocrystals |
| CSA Z5100/Z5200 PACKAGE : 2017 | CONSISTS OF Z5100-17, CELLULOSE NANOMATERIALS - TEST METHODS FOR CHARACTERIZATION AND Z5200-17, CELLULOSE NANOMATERIALS - BLANK DETAIL SPECIFICATION |
| ISO 19606:2017 | Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy |
| ISO/TR 14187:2011 | Surface chemical analysis Characterization of nanostructured materials |
| ISO 12179:2000 | Geometrical Product Specifications (GPS) Surface texture: Profile method Calibration of contact (stylus) instruments |
| IEC TS 62622:2012 | Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| ISO 11039:2012 | Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate |
| ISO Guide 30:2015 | Reference materials — Selected terms and definitions |
| ISO 3274:1996 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments |
| ISO 12853:2015 | Microscopes Information provided to the user |
| ISO 5436-1:2000 | Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 1: Material measures |
| ISO 18115-2:2013 | Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy |
| ISO Guide 34:2009 | General requirements for the competence of reference material producers |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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