ISO 16243:2011
Current
The latest, up-to-date edition.
Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English, French
25-11-2011
ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
DevelopmentNote |
Supersedes ISO/DIS 16243. (11/2011)
|
DocumentType |
Standard
|
Pages |
9
|
PublisherName |
International Organization for Standardization
|
Status |
Current
|
Standards | Relationship |
NEN ISO 16243 : 2011 | Identical |
BS ISO 16243:2011 | Identical |
NF ISO 16243 : 2012 | Identical |
ISO 13424:2013 | Surface chemical analysis X-ray photoelectron spectroscopy Reporting of results of thin-film analysis |
BS ISO 13424:2013 | Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis |
ISO 15472:2010 | Surface chemical analysis X-ray photoelectron spectrometers Calibration of energy scales |
ISO 18115-1:2013 | Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy |
ISO 18117:2009 | Surface chemical analysis — Handling of specimens prior to analysis |
ISO/TR 15969:2001 | Surface chemical analysis Depth profiling Measurement of sputtered depth |
ISO 18116:2005 | Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis |
ISO 20903:2011 | Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results |
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