ISO 16243:2011
Current
Current
The latest, up-to-date edition.
Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Available format(s)
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
Language(s)
English, French
Published date
25-11-2011
Important note : Users cannot be edited or removed once added to your Multi user PDF.
ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
| Committee |
ISO/TC 201/SC 2
|
| DevelopmentNote |
Supersedes ISO/DIS 16243. (11/2011)
|
| DocumentType |
Standard
|
| Pages |
9
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| NEN ISO 16243 : 2011 | Identical |
| BS ISO 16243:2011 | Identical |
| NF ISO 16243 : 2012 | Identical |
| ISO 13424:2013 | Surface chemical analysis X-ray photoelectron spectroscopy Reporting of results of thin-film analysis |
| BS ISO 13424:2013 | Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis |
| ISO 15472:2010 | Surface chemical analysis X-ray photoelectron spectrometers Calibration of energy scales |
| ISO 18115-1:2013 | Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy |
| ISO 18117:2009 | Surface chemical analysis — Handling of specimens prior to analysis |
| ISO/TR 15969:2001 | Surface chemical analysis Depth profiling Measurement of sputtered depth |
| ISO 18116:2005 | Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis |
| ISO 20903:2011 | Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods used to determine peak intensities and information required when reporting results |
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