ISO 16700:2004
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
23-02-2019
English, French
05-03-2004
Important note : Users cannot be edited or removed once added to your Multi user PDF.
ISO 16700:2004 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| BS ISO 16700:2004 | Identical |
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