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ISO 17862:2013

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

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Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Withdrawn date

23-09-2022

Superseded by

ISO 17862:2022

Language(s)

English

Published date

10-12-2013

€60.00
Excluding VAT

ISO 17862:2014 specifies a method for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale in single ion counting time-of-flight (TOF) secondary ion mass spectrometers using a test based on isotopic ratios in spectra from poly(tetrafluoroethylene) (PTFE). It also includes a method to correct for intensity nonlinearity arising from intensity lost from a microchannel plate (MCP) or scintillator and photomultiplier followed by a time-to-digital converter (TDC) detection system caused by secondary ions arriving during its dead-time. The correction can increase the intensity range for 95 % linearity by a factor of up to more than 50 so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction formulae have been shown to be valid. ISO 17862:2014 can also be used to confirm the validity of instruments in which the dead-time correction is already made but in which further increases can or cannot be possible.

DevelopmentNote
Supersedes ISO/DIS 17862. (12/2013)
DocumentType
Standard
Pages
25
PublisherName
International Organization for Standardization
Status
Withdrawn
SupersededBy

Standards Relationship
BS ISO 17862:2013 Identical

ISO 23830:2008 Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
ISO 18116:2005 Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis
ISO 13084:2011 Surface chemical analysis Secondary-ion mass spectrometry Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

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