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ISO 17915:2018

Current

Current

The latest, up-to-date edition.

Optics and photonics — Measurement method of semiconductor lasers for sensing

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English

Published date

25-05-2018

€144.00
Excluding VAT

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

Committee
ISO/TC 172/SC 9
DevelopmentNote
Supersedes ISO/DIS 17915 and ISO TS 17915. (05/2018)
DocumentType
Standard
Pages
29
PublisherName
International Organization for Standardization
Status
Current
Supersedes

Standards Relationship
BS ISO 17915:2018 Identical
NEN ISO 17915:2018 Identical

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IEC 60747-5-2:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
ISO 11145:2016 Optics and photonics Lasers and laser-related equipment Vocabulary and symbols

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