ISO 17915:2018
Current
The latest, up-to-date edition.
Optics and photonics — Measurement method of semiconductor lasers for sensing
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English
25-05-2018
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.
Committee |
ISO/TC 172/SC 9
|
DevelopmentNote |
Supersedes ISO/DIS 17915 and ISO TS 17915. (05/2018)
|
DocumentType |
Standard
|
Pages |
29
|
PublisherName |
International Organization for Standardization
|
Status |
Current
|
Supersedes |
Standards | Relationship |
BS ISO 17915:2018 | Identical |
NEN ISO 17915:2018 | Identical |
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IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
IEC 60050-521:2002 | International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits |
ISO 11145:2016 | Optics and photonics Lasers and laser-related equipment Vocabulary and symbols |
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