![header thumbnail](/images/publishers\iso_cover.gif)
ISO 17915:2018
Current
The latest, up-to-date edition.
![header thumbnail](/images/publishers\iso_cover.gif)
Optics and photonics — Measurement method of semiconductor lasers for sensing
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
25-05-2018
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.