ISO 18117:2009
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Surface chemical analysis — Handling of specimens prior to analysis
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
18-09-2024
English, French
03-03-2009
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ISO 18117:2009 gives guidance on the handling of and the containers for specimens submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly the following: Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable to other analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances, with particular specimens, further precautions may be necessary.
| Committee |
ISO/TC 201/SC 2
|
| DevelopmentNote |
Supersedes ISO/DIS 18117. (03/2009)
|
| DocumentType |
Standard
|
| Pages |
9
|
| ProductNote |
THIS STANDARD ALSO HAVE CORRECT VERSION FOR EN&FR:2009
|
| PublisherName |
International Organization for Standardization
|
| Status |
Superseded
|
| SupersededBy | |
| UnderRevision |
| Standards | Relationship |
| BS ISO 18117:2009 | Identical |
| NF ISO 18117 : 2009 | Identical |
| NEN ISO 18117 : 2009 | Identical |
| SAC GB/T 28894 : 2012 | Identical |
| BS ISO 10810:2010 | Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis |
| ISO 10810:2010 | Surface chemical analysis X-ray photoelectron spectroscopy Guidelines for analysis |
| BS ISO 16242:2011 | Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES) |
| ISO 13424:2013 | Surface chemical analysis X-ray photoelectron spectroscopy Reporting of results of thin-film analysis |
| ASTM E 2735 : 2014 : REDLINE | Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments |
| BS ISO 29081:2010 | Surface chemical analysis. Auger electron spectroscopy. Reporting of methods used for charge control and charge correction |
| BS ISO 13424:2013 | Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of results of thin-film analysis |
| BS ISO 16243:2011 | Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS) |
| ISO 16242:2011 | Surface chemical analysis — Recording and reporting data in Auger electron spectroscopy (AES) |
| ISO 16243:2011 | Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS) |
| 09/30191895 DC : 0 | BS ISO 10810 - SURFACE CHEMICAL ANALYSIS - X-RAY PHOTOELECTRON SPECTROSCOPY - GUIDELINES FOR ANALYSIS |
| ISO 29081:2010 | Surface chemical analysis Auger electron spectroscopy Reporting of methods used for charge control and charge correction |
| ISO 18115:2001 | Surface chemical analysis Vocabulary |
| ASTM E 1829 : 2014 : REDLINE | Standard Guide for Handling Specimens Prior to Surface Analysis |
| ISO 18116:2005 | Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis |
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