ISO 19606:2017
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for surface roughness of fine ceramic films by atomic force microscopy
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
01-11-2024
English
13-01-2017
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ISO 19606:2017 describes a method to evaluate the adequateness of a probe tip for fine-ceramic thin-film surface roughness measurements by atomic force microscopy, of surfaces with an arithmetical mean roughness, Ra, in the range of about 1 nm to 30 nm and a mean width of roughness profile elements, RSm, in the range of about 0,04 μm to 2,5 μm.
| Committee |
ISO/TC 206
|
| DevelopmentNote |
Supersedes ISO/DIS 19606. (01/2017)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
International Organization for Standardization
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| BS ISO 19606:2017 | Identical |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| ISO 11039:2012 | Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate |
| ISO 25178-3:2012 | Geometrical product specifications (GPS) — Surface texture: Areal — Part 3: Specification operators |
| ISO 16610-21:2011 | Geometrical product specifications (GPS) — Filtration — Part 21: Linear profile filters: Gaussian filters |
| ISO 18115-2:2013 | Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy |
| ISO 11952:2014 | Surface chemical analysis Scanning-probe microscopy Determination of geometric quantities using SPM: Calibration of measuring systems |
| ISO 11775:2015 | Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants |
| ISO 25178-2:2012 | Geometrical product specifications (GPS) Surface texture: Areal Part 2: Terms, definitions and surface texture parameters |
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