ISO 24173:2009
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
09-02-2024
English, French
14-09-2009
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ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
| Committee |
ISO/TC 202
|
| DevelopmentNote |
Supersedes ISO/DIS 24173. (09/2009)
|
| DocumentType |
Standard
|
| Pages |
43
|
| PublisherName |
International Organization for Standardization
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NF ISO 24173 : 2009 | Identical |
| DIN ISO 24173:2013-04 | Identical |
| BS ISO 24173:2009 | Identical |
| NEN ISO 24173 : 2009 | Identical |
| SAC GB/T 30703 : 2014 | Identical |
| PD CEN ISO/TS 80004-6:2015 | Nanotechnologies. Vocabulary Nano-object characterization |
| CEN ISO/TS 80004-6:2015 | Nanotechnologies - Vocabulary - Part 6: Nano-object characterization (ISO/TS 80004-6:2013) |
| BS PD ISO/TS 80004-6 : 2013 | NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION |
| ISO 19214:2017 | Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy |
| PD ISO/TR 18196:2016 | Nanotechnologies. Measurement technique matrix for the characterization of nano-objects |
| NF ISO 13067 : 2012 | MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE |
| S.R. CEN ISO/TS 80004-6:2015 | NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013) |
| BS ISO 13067:2011 | Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size |
| DIN ISO 13067:2015-12 | Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011) |
| ISO/TR 10993-22:2017 | Biological evaluation of medical devices — Part 22: Guidance on nanomaterials |
| ISO 13067:2011 | Microbeam analysis Electron backscatter diffraction Measurement of average grain size |
| ASTM F 3160 : 2016 | Standard Guide for Metallurgical Characterization of Absorbable Metallic Materials for Medical Implants |
| ISO/TR 18196:2016 | Nanotechnologies — Measurement technique matrix for the characterization of nano-objects |
| ISO/TS 80004-6:2013 | Nanotechnologies Vocabulary Part 6: Nano-object characterization |
| PD ISO/TR 10993-22:2017 | Biological evaluation of medical devices Guidance on nanomaterials |
| ISO/IEC 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| SAC GB/T 19501 : 2013 | MICROBEAM ANALYSIS - GENERAL GUIDE FOR ELECTRON BACKSCATTER DIFFRACTION ANALYSIS |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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