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  • ISO 24173:2009

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    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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    Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction

    Available format(s):  PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Superseded date:  09-02-2024

    Language(s):  English, French

    Published date:  14-09-2009

    Publisher:  International Organization for Standardization

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    Abstract - (Show below) - (Hide below)

    ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

    General Product Information - (Show below) - (Hide below)

    Committee ISO/TC 202
    Development Note Supersedes ISO/DIS 24173. (09/2009)
    Document Type Standard
    Publisher International Organization for Standardization
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    PD CEN ISO/TS 80004-6:2015 Nanotechnologies. Vocabulary Nano-object characterization
    CEN ISO/TS 80004-6:2015 NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013)
    BS PD ISO/TS 80004-6 : 2013 NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION
    ISO 19214:2017 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
    PD ISO/TR 18196:2016 Nanotechnologies. Measurement technique matrix for the characterization of nano-objects
    DIN ISO 13067 E : 2015 MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE (ISO 13067:2011)
    NF ISO 13067 : 2012 MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE
    S.R. CEN ISO/TS 80004-6:2015 NANOTECHNOLOGIES - VOCABULARY - PART 6: NANO-OBJECT CHARACTERIZATION (ISO/TS 80004-6:2013)
    BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
    DIN ISO 13067:2015-12 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
    ISO/TR 10993-22:2017 Biological evaluation of medical devices — Part 22: Guidance on nanomaterials
    ISO 13067:2011 Microbeam analysis Electron backscatter diffraction Measurement of average grain size
    ASTM F 3160 : 2016 Standard Guide for Metallurgical Characterization of Absorbable Metallic Materials for Medical Implants
    ISO/TR 18196:2016 Nanotechnologies — Measurement technique matrix for the characterization of nano-objects
    ISO/TS 80004-6:2013 Nanotechnologies Vocabulary Part 6: Nano-object characterization
    PD ISO/TR 10993-22:2017 Biological evaluation of medical devices Guidance on nanomaterials

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO/IEC 17025:2005 General requirements for the competence of testing and calibration laboratories
    SAC GB/T 19501 : 2013 MICROBEAM ANALYSIS - GENERAL GUIDE FOR ELECTRON BACKSCATTER DIFFRACTION ANALYSIS
    ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)
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