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JEDEC JESD93A:2022

Current

Current

The latest, up-to-date edition.

MULTICHIP MODULES (MCM)

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-10-2022

Free

This specification establishes the general requirements for Multi-Chip Modules (MCM); hereafter referred to as devices (see Terms and Definitions section).

DocumentType
Revision
Pages
22
PublisherName
JEDEC Solid State Technology Association
Status
Current
Supersedes

JEDEC JEP 131C : 2018 POTENTIAL FAILURE MODE AND EFFECTS ANALYSIS (FMEA)
JEDEC JESD 94B : 2015 Application Specific Qualification Using Knowledge Based Test Methodology
JEDEC JESD91B:2022 Method for Developing Acceleration Models for Electronic Device Failure Mechanisms
ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
JEDEC JEP122H:2016 FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES
JEDEC JEP148B:2014(R2019) RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
JEDEC JEP150.01:2013 STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS

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