JIS C 2570-1:2006
Withdrawn
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
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Directly heated negative temperature coefficient thermistors -- Part 1: Generic specification
Published date
20-01-2006
Publisher
Withdrawn date
23-10-2025
Superseded by
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| DocumentType |
Standard
|
| ProductNote |
Supersedes JIS C2570 (05/2006)
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
| SupersededBy | |
| Supersedes |
2006 [20/01/2006]
| JIS C 60068-2-17:2001 | Basic environmental testing procedures -- Part 2: Tests -- Test Q: Sealing |
| JIS C 6484:2005 | Base materials for printed circuits -- Epoxide woven E-glass laminated sheet of defined flammability (vertical burning test) |
| JIS C 60068-2-11:1989 | Basic environmental testing procedures Part 2: Tests -- Test Ka: Salt mist Part 2: Tests - Test Ka: Salt mist |
| JIS C 60068-2-13:1989 | Basic environmental testing procedures Part 2: Tests, Test M: Low air pressure Part 2: Tests, Test M: Low air pressure |
| JIS C 60068-1:1993 | Environmental testing Part 1: General and guidance Part 1: General and guidance |
| JIS C 60068-2-52:2000 | Environmental testing -- Part 2: Tests -- Test Kb: Salt mist, cyclic (sodium chloride solution) Part 2: Tests - Test Kb: Salt mist, cyclic (sodium, chloride solution) |
| JIS C 5062:2008 | Marking codes for resistors and capacitors |
| JIS C 60068-2-32:1995 | Environmental testing Part 2: Tests. Test Ed: Free fall Part 2: Tests. Test Ed: Free fall |
| JIS C 60068-2-21:2002 | Environmental testing -- Part 2-21: Tests -- Test U: Robustness of termination and integral mounting devices Part 2-21: Tests - Test U: Robustness of termination and integral mounting devices |
| JIS C 60068-2-45:1995 | Environmental testing procedures of electronic and electrical resistance to solvents (immersion in cleaning solvents) |
| JIS C 60068-2-20:1996 | Basic environmental testing procedures Part 2: Tests. Test T: Soldering Part 2: Tests. Test T: Soldering |
| JIS C 60068-2-58:2006 | Environmental testing -- Part 2: Tests -- Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
| JIS C 2570-2:2008 | Directly heated negative temperature coefficient thermistors -- Part 2: Sectional specification -- Surface mount negative temperature coefficient thermistors |
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