JIS C 60068-2-70:2007
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Environmental testing -- Part 2: Tests -- Test Xb: Abrasion of markings and letterings caused by rubbing of fingers and hands
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JIS C 2570:1998
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Directly heated negative temperature coefficient thermistors |
JIS C 60068-2-65:2006
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Environmental Testing - Part 2-65: Vibration, Acoustically Induced |
JIS C 5321:1997
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Methods of test for high frequency inductors and intermediate frequency transformers for electronic equipment |
JIS C 5101-9:1998
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Fixed capacitors for use in electronic equipment. Part 9: Sectional specification: Fixed capacitors of ceramic dielectric, class 2 |
JIS C 5201-4:1998
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Fixed resistors for use in electronic equipment. Part 4: Sectional specification: Fixed power resistors |
JIS C 0664:2003
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Insulation Coordination For Low-voltage Equipment - Principles, Requirements And Tests |
JIS C 2560-2:2006
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Cores Made Of Ferrite - Measuring Methods |
JIS C 5101-22:2006
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Fixed Capacitors For Use In Electronic Equipment - Part 22: Sectional Specification: Fixed Surface Mount Multilayer Capacitors Of Ceramic Dielectric, Class 2 |
JIS C 0920:2003
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Degrees of protection provided by enclosures (IP Code) |
JIS C 60068-2-78:2004
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Environmental testing Part 2-78: Tests - Test Cab: Damp heat, steady state |
JIS C 5504:1992
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Horn type loudspeakers |
JIS C 5101-14:1998
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Fixed capacitors for use in electronic equipment. Part 14: Sectional specification: Fixed capacitors for electromagnetic interference suppression and connection to the supply mains |
JIS C 6965:2007
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Mechanical Safety Of Cathode Ray Tubes |
JIS C 6821:1999
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Test Methods For Mechanical Characteristics Of Optical Fibers |
JIS C 5260-1:1999
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Potentiometers for use in electronic equipment Part 1: Generic specification |
JIS C 5101-15:1998
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Fixed capacitors for use in electronic equipment. Part 15: Sectional specification: Fixed tantalum capacitors with non-solid or solid electrolyte |
JIS C 60068-2-57:2002
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Environmental testing - Electrotechnical products - Time-history vibration test method |
JIS X 5150:2004
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Information Technology - Generic Cabling For Customer Premises |
JIS C 5502:1991
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Microphones |
JIS C 60068-2-59:2001
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Environmental testing Part 2: Test methods Test Fe: Vibration - Sine-beat method |
JIS C 6703:2002
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Generic specification of crystal filters |
JIS C 6703:2008
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Crystal filters |
JIS R 1651:2002
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Method For Measurement Of Pyroelectric Coefficient Of Fine Ceramics |
JIS C 6840:2006
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Polarization Crosstalk Measurement Of Optical Fiber |
JIS C 0704:1995
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Insulation test for control gear |
JIS C 5101-8:1998
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Fixed capacitors for use in electronic equipment. Part 8: Sectional specification: Fixed capacitors of ceramic dielectric, class 1 |
JIS C 5201-6:1999
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Fixed resistors for use in electronic equipment Part 6: Sectional specification: Fixed resistor networks with individually measurable resistors |
JIS C 2811:1995
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Terminal blocks for industrial and similar use |
JIS C 5871:1992
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Test methods of interference filter |
JIS C 5401-4:2005
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Connectors for electronic equipment Part 4: Printed board connectors with assessed quality - Sectional specification |
JIS C 6827:2005
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Test methods for chromatic dispersion of optical fibers |
JIS C 60068-3-5:2006
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Environmental Testing - Part 3-5: Supporting Documentation And Guidance - Confirmation Of The Performance Of Temperature Chambers |
JIS C 60068-2-41:1995
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Environmental testing Part 2: Tests, Test Z/BM: Combined dry heat/low air pressure tests Part 2: Tests, Test Z/BM: Combined dry heat/low air pressure tests |
JIS C 5402:1992
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Method for test of connectors for use in electronic equipment |
JIS C 60068-2-81:2007
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Environmental testing -- Part 2-81: Shock -- Shock response spectrum synthesis Part 2-81: Shock - Shock response spectrum synthesis |
JIS C 6834:1999
|
Plastic Cladding Multimode Optical Fibers |
JIS C 6861:1999
|
Test Methods For Mechanical Characteristics Of All Plastic Multimode Optical Fibers |
JIS C 5963:2001
|
General Rules Of Connectors With Optical Fiber Cables |
JIS C 6871:2008
|
Test Methods For Structural Parameters Of Polarization-maintaining Optical Fibers |
JIS C 6872:2008
|
Beat Length Measurement Of Polarization-maintaining Optical Fibers |
JIS C 6863:1990
|
Test methods for attenuation of all plastic multimode optical fibers |
JIS C 61000-4-14:2004
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Electromagnetic Compatibility (emc) - Part 4-14: Testing And Measurement Techniques - Voltage Fluctuation Immunity Test |
JIS C 5101-17:2000
|
Fixed capacitors for use in electronic equipment Part 17: Sectional specification: Fixed metallized polypropylene film dielectric a.c. and pulse capacitors |
JIS C 5402-12-6:2002
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Connectors For Electronic Equipment - Tests And Measurements - Part 12-6: Soldering Tests - Test 12f: Sealing Against Flux And Cleaning Solvents In Machine Soldering |
JIS C 6521:1996
|
Test methods of prepreg for multilayer printed wiring boards |
JIS C 5201-8:1998
|
Fixed resistors for use in electronic equipment. Part 8: Sectional specification: Fixed chip resistors |
JIS D 1304:2004
|
Electric vehicle -- Charging system -- Test method of efficiency |
JIS C 0099:2005
|
Environmental testing: Tests - Test: Test methods for solderability of surface mounting devices (SMD) by wetting balance using lead-free solder paste |
JIS D 5301:2006
|
Lead-acid starter batteries |
JIS C 5012:1993
|
Test methods for printed wiring boards |
JIS C 5381-331:2006
|
Components For Low-voltage Surge Protective Devices - Part 331: Specification For Metal Oxide Varistors (mov) |
JIS C 60068-2-51:1997
|
Basic environmental testing procedures Part 2: Tests Tests Z/BFc: Combined dry heat/vibration (sinusoidal) tests for both heat-dissipating and non-heat-dissipating specimens |
JIS C 6462:1996
|
Test methods of variable capacitors for use in electronic equipment |
JIS C 5401-2:2005
|
Connectors For Electronic Equipment - Part 2: Circular Connectors With Assessed Quality - Sectional Specification |
JIS C 8702-1:2003
|
Small-sized valve regulated lead-acid batteries Part 1: General requirements, functional characteristics - Methods of test |
JIS C 5101-2:1998
|
Fixed capacitors for use in electronic equipment. Part 2: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric d.c. capacitors |
JIS C 6839:2001
|
Optical fiber ribbon cords |
JIS C 6435:1989
|
Testing methods for low frequency transformers and inductors |
JIS C 5101-23:2008
|
Fixed Capacitors For Use In Electronic Equipment - Part 23: Sectional Specification - Fixed Surface Mount Metallized Polyethylene Naphthalate Film Dielectric Dc Capacitors |
JIS C 6436:1995
|
Power transformer for electronic equipment |
JIS C 5201-2:1998
|
Fixed resistors for use in electronic equipment. Part 2: Sectional specification: Fixed low-power non-wirewound resistors |
JIS C 5201-5:1998
|
Fixed resistors for use in electronic equipment. Part 5: Sectional specification: Fixed precision resistors |
JIS C 60068-2-7:1993
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Basic environmental testing procedures Part 2: Tests -- Test Ga and guidance: Acceleration, steady state Part 2: Tests - Test Ga and guidance: Acceleration, steady state |
JIS C 5873:1992
|
Test methods of optical isolators for light beam transmission |
JIS D 1303:2004
|
Electric vehicles - Batteries - Test method of charging efficiency |
JIS C 6701:2007
|
Generic specification of quartz crystal units |
JIS C 6830:1998
|
Optical Fiber Cords |
JIS C 61000-4-20:2006
|
Electromagnetic Compatibility (emc) - Part 4-20: Testing And Measurement Techniques - Emission And Immunity Testing In Transverse Electromagnetic (tem) Waveguides |
JIS C 6710:2007
|
Generic specification of crystal controlled oscillators |
JIS C 6443:1995
|
Carbon potentiometers for general use |
JIS C 5101-21:2006
|
Fixed Capacitors For Use In Electronic Equipment - Part 21: Sectional Specification: Fixed Surface Mount Multilayer Capacitors Of Ceramic Dielectric, Class 1 |
JIS C 60068-2-61:1996
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Environmental testing Part 2: Test methods Test Z/ABDM: Climatic sequence |
JIS C 5101-20:2000
|
Fixed capacitors for use in electronic equipment Part 20: Sectional specification: Fixed metallized polyphenylene sulfide film dielectric chip d.c. capacitors |
JIS C 61000-4-17:2004
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Electromagnetic Compatibility (emc) - Part 4: Testing And Measurement Techniques - Section 17: Ripple On D.c. Input Power Port Immunity Test |
JIS C 60068-2-75:2004
|
Environmental Testing - Part 2-75: Tests - Test Eh: Hammer Test |
JIS TS C8992-2:2006
|
Photovoltaic (pv) Modules Safety Qualification - Part 2: Requirements For Testing |
JIS C 2809:1999
|
Flat, Quick-connect Terminations |
JIS C 60068-2-21:2002
|
Environmental testing Part 2-21: Tests - Test U: Robustness of termination and integral mounting devices |
JIS C 5101-13:1999
|
Fixed capacitors for use in electronic equipment Part 13: Sectional specification: Fixed polypropylene film dielectric metal foil d.c. capacitors |
JIS C 60068-2-52:2000
|
Environmental testing Part 2: Tests - Test Kb: Salt mist, cyclic (sodium, chloride solution) |
JIS C 5441:1994
|
Testing methods of switches for use in electronic equipment |
JIS C 6838:2001
|
Fiber ribbons |
JIS C 60068-2-40:1995
|
Environmental testing Part 2: Tests, Test Z/AM: Combined cold/low air pressure tests |
JIS C 5202:1990
|
Test methods of fixed resistors for electronic equipment |
JIS C 6824:1997
|
Test methods for bandwidth of multimode optical fibers |
JIS C 5935:2005
|
Measurement methods of lenses for fiber optic transmission |
JIS C 5101-16:1999
|
Fixed capacitors for use in electronic equipment Part 16: Sectional specification: Fixed metallized polypropylene film dielectric d.c. capacitors |
JIS C 5401-1:2005
|
Connectors for electronic equipment Part 1: Generic specification |
JIS C 6825:1995
|
Test methods for structural parameters of single-mode optical fibers |
JIS C 6832:1999
|
Silica Glass Multimode Optical Fibers |
JIS C 8826:2008
|
Testing methods of power conditioner for grid interconnected small polymer electrolyte fuel cell power systems |
JIS C 60068-2-64:1997
|
Environmental testing Part 2: Test methods - Test Fh: Vibration, broad-band random (digital control) and guidance |
JIS C 5101-18:1999
|
Fixed capacitors for use in electronic equipment Part 18: Sectional specification: Fixed aluminium electrolytic chip capacitors with solid (MnO2) and non-solid electrolyte |
JIS C 5101-11:1998
|
Fixed capacitors for use in electronic equipment. Part 11: Sectional specification: Fixed polyethylene-terephthalate film dielectric metal foil d.c. capacitors |
JIS C 5260-5:2000
|
Potentiometers For Use In Electronic Equipment - Part 5: Sectional Specification: Single-turn Rotary Low-power Wirewound Potentiometers |
JIS C 5260-2:2000
|
Potentiometers For Use In Electronic Equipment - Part 2 - Sectional Specification: Lead-screw Actuated And Rotary Preset Potentiometers |
JIS C 5401-4-001:2005
|
Connectors for electronic equipment -- Part 4-001: Printed Board Connectors with assessed quality -- Blank Detail Specification
|
JIS C 5201-1:1998
|
Fixed resistors for use in electronic equipment Part 1: Generic specification |
JIS C 5260-4:2000
|
Potentiometers For Use In Electronic Equipment - Part 4: Sectional Specification: Single-turn Rotary Power Potentiometers |
JIS C 5311:1994
|
Testing methods of power transformers for electronic equipment |
JIS C 6445:1995
|
Wirewound potentiometers |
JIS C 5401-2-001:2005
|
Connectors For Electronic Equipment - Part 2-001: Circular Connectors - Blank Detail Specification |
JIS C 6851:2006
|
Optical Fiber Cable Test Procedures |
JIS C 60068-3-8:2006
|
Environmental Testing - Part 3-8: Supporting Documentation And Guidance - Selecting Amongst Vibration Tests |
JIS C 4402:2004
|
Thyristor rectifiers for floating charge |
JIS C 60068-2-48:2004
|
Environmental Testing - Tests - Guidance On The Application Of Tests For Jis Environmental Testing Series To Simulate The Effects Of Storage |
JIS C 60068-2-11:1989
|
Basic environmental testing procedures Part 2: Tests - Test Ka: Salt mist |
JIS C 5860:1997
|
General rules of passive devices for light beam transmission |
JIS C 5401:1991
|
General rules of connectors for use in electronic equipment |
JIS C 60068-3-7:2008
|
Environmental Testing - Part 3-7: Supporting Documentation And Guidance - Measurements In Temperature Chambers For Tests A And B (with Load) |
JIS C 6471:1995
|
Test methods of copper-clad laminates for flexible printed wiring boards |
JIS C 2570-1:2006
|
Directly Heated Negative Temperature Coefficient Thermistors - Part 1: Generic Specification |
JIS C 5381-21:2004
|
Surge protective devices connected to telecommunications and signalling networks - Performance requirements and testing methods |
JIS C 6822:1995
|
Test methods for structural parameters of multimode optical fibers |
JIS C 60068-2-50:1997
|
Basic environmental testing procedures Part 2: Tests Tests Z/Afc: Combined cold/vibration (sinusoidal) tests for both heat-dissipating and non-heat-dissipating specimens |
JIS E 4035:1995
|
Railway rolling stock -- High and low temperature test methods of parts |
JIS C 61000-4-2:1999
|
Electromagnetic Compatibility (emc) - Part 4: Testing And Measurement Techniques - Section 2: Electrostatic Discharge Immunity Test |
JIS C 5933:1993
|
Test methods of optical isolators for fiber optic transmission |
JIS C 6481:1996
|
Test methods of copper-clad laminates for printed wiring boards |
JIS C 60721-3-3:1997
|
Classification of environmental conditions Part 3: Classification of groups of environmental parameters and their severities Section 3: Stationary use at weatherprotected locations Part 3: Classification of groups of environmental parameters and their severities Section 3: Stationary use at weatherprotected locations |
JIS C 60068-2-47:2008
|
Environmental testing Part 2-47: Tests - Mounting of specimens for vibration, impact and similar dynamic tests |
JIS C 60068-2-13:1989
|
This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. Part 2: Tests, Test M: Low air pressure |
JIS C 5401-3:2005
|
Connectors For Electronic Equipment - Part 3: Rectangular Connectors With Assessed Quality - Sectional Specification |
JIS C 1000-4-2:1999
|
Electromagnetic Compatibility (emc) - Part 4: Testing And Measurement Techniques - Section 2: Electrostatic Discharge Immunity Test |
JIS C 5260-3:2000
|
Potentiometers For Use In Electronic Equipment - Part 3 - Sectional Specification: Rotary Precision Potentiometers |
JIS C 5402-1:2002
|
Connectors For Electronic Equipment - Tests And Measurements - Part 1: General |
JIS F 8007:2004
|
Shipbuilding - Electrical Equipments - General Requirements For Degrees Of Protection And Inspection Of Enclosures |
JIS C 8972:1997
|
Testing procedure of long discharge rate lead-acid batteries for photovoltaic systems |
JIS C 5101-4:1998
|
Fixed capacitors for use in electronic equipment. Part 4: Sectional specification: Aluminium electrolytic capacitors with solid and non-solid electrolyte |
JIS C 60068-3-3:2000
|
Environmental testing -- Part 3: Guidance Seismic test method for equipments |
JIS C 6833:1999
|
Multicomponent Glass Multimode Optical Fibers |
JIS C 0046:1993
|
Environmental testing Part 2: Test methods Test Eg: Impact, spring hammer |
JIS C 5101-3:1998
|
Fixed capacitors for use in electronic equipment. Part 3: Sectional specification: Fixed tantalum chip capacitors |
JIS C 5101-10:1999
|
Fixed capacitors for use in electronic equipment Part 10: Sectional specification: Fixed multilayer ceramic chip capacitors |
JIS C 6831:2001
|
Jacketed Optical Fibers |
JIS C 60068-2-17:2001
|
Basic environmental testing procedures -- Part 2: Tests -- Test Q: Sealing Part 2: Tests - Test Q: Sealing |
JIS C 60068-2-58:2006
|
Environmental Testing - Part 2: Tests - Test Td: Test Methods For Solderability, Resistance To Dissolution Of Metallization And To Soldering Heat Of Surface Mounting Devices (smd) |
JIS C 0055:2000
|
Environmental testing -- Part 3: Guidance Seismic test method for equipments |
JIS C 6836:1999
|
All Plastic Multimode Optical Fiber Cords |
JIS C 60068-2-56:1996
|
Environmental testing Part 2: Tests. Test Cb: Damp heat, steady state, primarily for equipment |