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  • JIS C 5101-1:2023

    Current The latest, up-to-date edition.

    Fixed capacitors for use in electronic equipment -- Part 1: Generic specification

    Available format(s):  Hardcopy

    Language(s):  Japanese

    Published date:  20-11-2023

    Publisher:  Japanese Standards Association

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    Document Type Revision
    Publisher Japanese Standards Association
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    JIS C 60068-2-14:2011 Environmental testing Part 2-14: Tests - Test N: Change of temperature
    JIS C 60068-2-45:1995 Environmental testing procedures of electronic and electrical resistance to solvents (immersion in cleaning solvents)
    JIS C 60068-2-69:2019 Environmental testing -- Part 2-69: Tests -- Test Te/Tc: Solderability testing of electronic components and printed boards by the wetting balance (force measurement) method
    JIS C 60068-2-27:2011 Environmental testing -- Part 2-27: Tests -- Test Ea: Shock
    JIS C 60068-2-30:2011 Environmental testing -- Part 2-30: Tests -- Test Db: Damp heat, cyclic (12 h + 12 h cycle)
    JIS C 60068-2-6:2010 Environmental testing Part 2-6: Tests - Test Fc: Vibration (sinusoidal)
    JIS C 60068-1:2016 Environmental Testing - Part 1: General And Guidance
    JIS C 60068-2-21:2023 Environmental testing -- Part 2-21: Tests -- Test U: Robustness of terminations and integral mounting devices
    JIS C 60068-2-2:2010 Environmental testing -- Part 2-2 : Tests -- Test B: Dry heat Part 2-2 : Tests - Test B: Dry heat
    JIS C 60068-2-78:2015 Environmental Testing - Part 2-78: Tests - Test Cab: Damp Heat, Steady State
    JIS C 60068-2-67:2001 Environmental testing -- Part 2: Tests -- Test Cy: Damp heat, steady state, accelerated test primarily intended for components Part 2: Tests - Test Cy: Damp heat, steady state, accelerated test primarily intended for components
    JIS C 60068-2-20:2022 Environmental testing -- Part 2-20: Tests -- Test T: Test methods for solderability and resistance to soldering heat of devices with leads
    JIS C 60068-2-82:2021 Environmental testing -- Part 2-82: Tests -- Test Xw1: Whisker test methods for components and parts used in electronic assemblies
    JIS C 60068-2-13:2023 Environmental testing -- Part 2-13: Tests -- Test M: Low air pressure
    JIS C 60068-2-58:2016 Environmental Testing - Part 2-58: Tests - Test Td: Test Methods For Solderability, Resistance To Dissolution Of Metallization And To Soldering Heat Of Surface Mounting Devices (smd)
    JIS C 60068-2-1:2010 Environmental testing Part 2-1: Tests - Test A: Cold
    JIS Z 8601:1954 Preferred numbers
    JIS C 60068-2-17:2001 Basic environmental testing procedures -- Part 2: Tests -- Test Q: Sealing Part 2: Tests - Test Q: Sealing
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