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  • JIS C 5402-1-1:2005

    Current The latest, up-to-date edition.

    Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination

    Available format(s):  Hardcopy, PDF

    Language(s):  Japanese, English

    Published date:  20-03-2005

    Publisher:  Japanese Standards Association

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    Table of Contents - (Show below) - (Hide below)

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    Abstract - (Show below) - (Hide below)

    This section of JIS C 5402-1 is to define a standard test method for the visual examination of electromechanical components.

    General Product Information - (Show below) - (Hide below)

    Document Type Test Method
    Publisher Japanese Standards Association
    Status Current

    History - (Show below) - (Hide below)

    Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]

    Standards Referencing This Book - (Show below) - (Hide below)

    JIS C 5402-5-1:2005 Connectors for electronic equipment - Tests and measurements Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise
    JIS C 5402-11-3:2005 Connectors for electronic equipment - Tests and measurements Part 11-3: Climatic tests - Test 11c: Damp heat, steady state
    JIS C 5402-6-2:2005 Connectors for electronic equipment -- Tests and measurements Part 6-2: Dynamic stress tests - Test 6b: Bump
    JIS C 5402-11-6:2005 Connectors for electronic equipment - Tests and measurements Part 11-6: Climatic tests - Test 11f: Corrosion, salt mist
    JIS C 5402-11-4:2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-4: Climatic tests -- Test 11d: Rapid change of temperature Part 11-4: Climatic tests - Test 11d: Rapid change of temperature
    JIS C 5402-11-7:2006 Connectors for electronic equipment -- Tests and measurements -- Part 11-7: Climatic tests -- Test 11g: Flowing mixed gas corrosion test
    JIS C 5402-11-10:2005 Connectors for electronic equipment - Tests and measurements Part 11-10: Climatic tests - Test 11j: Cold
    JIS C 5402-10-4:2006 Connectors For Electronic Equipment - Tests And Measurements - Part 10-4: Impact Tests (free Components), Static Load Tests (fixed Components), Endurance Tests And Overload Tests - Test 10d: Electrical Overload (connectors)
    JIS C 5402-6-1:2005 Connectors for electronic equipment - Tests and measurements Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state
    JIS C 5402-11-11:2005 Connectors for electronic equipment - Tests and measurements Part 11-11: Climatic tests - Test 11k: Low air pressure
    JIS C 5402-11-5:2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-5: Climatic tests -- Test 11e: Mould growth Part 11-5: Climatic tests - Test 11e: Mould growth
    JIS C 5402-6-3:2005 Connectors for electronic equipment -- Tests and measurements -- Part 6-3: Dynamic stress tests -- Test 6c: Shock Part 6-3: Dynamic stress tests - Test 6c: Shock
    JIS C 5402-11-12:2005 Connectors for electronic equipment - Tests and measurements Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic
    JIS C 5402-11-13:2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-13: Climatic tests -- Test 11n: Gas tightness, solderless wrapped connections
    JIS C 5402-11-14:2006 Connectors for electronic equipment - Tests and measurements Part 11-14: Climatic tests - Test 11p: Flowing single gas corrosion test
    JIS C 5402-6-4:2005 Connectors for electronic equipment -- Tests and measurements -- Part 6-4: Dynamic stress tests -- Test 6d: Vibration (sinusoidal)
    JIS C 5402-11-9:2005 Connectors for electronic equipment -- Tests and measurements -- Part 11-9: Climatic tests -- Test 11i: Dry heat Part 11-9: Climatic tests - Test 11i: Dry heat
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