JIS C 5402-10-4:2006
Current
Current
The latest, up-to-date edition.
Connectors For Electronic Equipment - Tests And Measurements - Part 10-4: Impact Tests (free Components), Static Load Tests (fixed Components), Endurance Tests And Overload Tests - Test 10d: Electrical Overload (connectors)
Available format(s)
Hardcopy
Language(s)
Japanese
Published date
25-03-2006
Publisher
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60512-10-4:2003 | Identical |
2006 [25/03/2006]
2002 [20/03/2002]
| JIS C 5402-2-1:2005 | Connectors for electronic equipment - Tests and measurements Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method |
| JIS C 5402-1-1:2005 | Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination |
| JIS C 5402-13-1:2002 | Connectors For Electronic Equipment - Tests And Measurements - Part 13-1: Mechanical Operating Tests - Test 13a: Engaging And Separating Forces |
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