JIS C 5402-11-11:2005
Current
The latest, up-to-date edition.
Connectors for electronic equipment - Tests and measurements Part 11-11: Climatic tests - Test 11k: Low air pressure
Hardcopy , PDF
English, Japanese
20-03-2005
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This section of JIS C 5402-11 is to define a standard test method to assess the ability of components to be stored and/or to function in a specified manner under specified conditions of low air pressure, for example high altitude.
| DocumentType |
Test Method
|
| Pages |
7
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60512-11-11:2002 | Identical |
Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]
| JIS C 60068-2-13:1989 | This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. Part 2: Tests, Test M: Low air pressure |
| JIS C 5402-1-1:2005 | Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination |
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