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  • JIS C 5402-11-11:2005

    Current The latest, up-to-date edition.

    Connectors for electronic equipment - Tests and measurements Part 11-11: Climatic tests - Test 11k: Low air pressure

    Available format(s):  Hardcopy, PDF

    Language(s):  English, Japanese

    Published date:  20-03-2005

    Publisher:  Japanese Standards Association

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    Abstract - (Show below) - (Hide below)

    This section of JIS C 5402-11 is to define a standard test method to assess the ability of components to be stored and/or to function in a specified manner under specified conditions of low air pressure, for example high altitude.

    General Product Information - (Show below) - (Hide below)

    Document Type Test Method
    Publisher Japanese Standards Association
    Status Current

    History - (Show below) - (Hide below)

    Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]

    Standards Referenced By This Book - (Show below) - (Hide below)

    JIS C 60068-2-13:1989 This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. Part 2: Tests, Test M: Low air pressure
    JIS C 5402-1-1:2005 Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination
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