JIS C 5402-11-12:2005
Current
The latest, up-to-date edition.
Connectors for electronic equipment - Tests and measurements Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic
Hardcopy , PDF
Japanese, English
20-03-2005
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This section of JIS C 5402-11 is to define a standard test method to assess the ability of components to be stored and/or to function under conditions of high relative humidity and to observe the effects of such high humidity when combined with important temperature changes. This test may also be used for similar devices when specified in a detail specification.
| DocumentType |
Test Method
|
| Pages |
0
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60512-11-12:2002 | Identical |
Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]
| JIS C 5402-1-1:2005 | Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination |
| JIS C 5402-2-1:2005 | Connectors for electronic equipment - Tests and measurements Part 2-1: Electrical continuity and contact resistance tests - Test 2a : Contact resistance - Millivolt level method |
| JIS C 5402-3-1:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance |
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