JIS C 5402-11-4:2005
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Connectors for electronic equipment -- Tests and measurements -- Part 11-4: Climatic tests -- Test 11d: Rapid change of temperature Part 11-4: Climatic tests - Test 11d: Rapid change of temperature
Hardcopy , PDF
English, Japanese
20-03-2005
This section of JIS C 5402-11 is to define a standard test method to assess the ability of components to withstand rapid change of temperature in air such as might occur during storage, transportation and use.
DocumentType |
Test Method
|
Pages |
7
|
PublisherName |
Japanese Standards Association
|
Status |
Current
|
Standards | Relationship |
IEC 60512-11-4:2002 | Identical |
Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]
JIS C 5402-1-1:2005 | Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination |
JIS C 5402-3-1:2005 | Connectors for electronic equipment -- Tests and measurements -- Part 3-1: Insulation tests -- Test 3a: Insulation resistance |
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