JIS C 5402-5-1:2005
Current
The latest, up-to-date edition.
Connectors for electronic equipment - Tests and measurements Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise
Hardcopy , PDF
Japanese, English
20-03-2005
This section of JIS C 5402-5 is to detail a standard test method to assess the ability of a component to carry its specified current, at room temperature, without exceeding a specified temperature rise.
DocumentType |
Standard
|
Pages |
0
|
PublisherName |
Japanese Standards Association
|
Status |
Current
|
Standards | Relationship |
IEC 60512-5-1:2002 | Identical |
Reaffirmed 2014 2005(R2014) [20/10/2014]2005(R2009) [01/10/2009]2005 [20/03/2005]
JIS C 5402-1-1:2005 | Connectors for electronic equipment --Tests and measurements-- Part 1-1: General examination -- Test 1a: Visual examination |
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