JIS C 60068-2-40:1995
Current
The latest, up-to-date edition.
Environmental testing Part 2: Tests, Test Z/AM: Combined cold/low air pressure tests
Hardcopy , PDF
English, Japanese
31-07-1995
This Japanese Industrial Standard deals with combined cold (with gradual or rapid change of temperature) and low air pressure tests for both heat-dissipating and non-heat-dissipating specimens (see Sub-claues 8.2.2 and 8.2.8).
DocumentType |
Standard
|
Pages |
11
|
PublisherName |
Japanese Standards Association
|
Status |
Current
|
Standards | Relationship |
IEC 60068-2-40:1976 | Identical |
IEC 60068-2-40:1976/AMD1:1983 | Identical |
Reaffirmed 2016
JIS C 60068-3-1:1995 | Background information, Section One - Cold and dry heat tests |
JIS C 60068-2-13:1989 | This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. Part 2: Tests, Test M: Low air pressure |
JIS C 60068-1:1993 | Environmental testing Part 1: General and guidance |
JIS C 5260-5:2000 | Potentiometers For Use In Electronic Equipment - Part 5: Sectional Specification: Single-turn Rotary Low-power Wirewound Potentiometers |
JIS C 5260-2:2000 | Potentiometers For Use In Electronic Equipment - Part 2 - Sectional Specification: Lead-screw Actuated And Rotary Preset Potentiometers |
JIS C 5260-4:2000 | Potentiometers For Use In Electronic Equipment - Part 4: Sectional Specification: Single-turn Rotary Power Potentiometers |
JIS C 5260-3:2000 | Potentiometers For Use In Electronic Equipment - Part 3 - Sectional Specification: Rotary Precision Potentiometers |
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