JIS C 60068-2-61:1996
Current
The latest, up-to-date edition.
Environmental testing Part 2: Test methods Test Z/ABDM: Climatic sequence
English
31-03-1996
This Japanese Industrial Standard provides standard composite test methods for determining the suitability of a specimen when subjected to environmental conditions consisting of a sequence of temperature, humidity and, where required, low air pressure environmental stresses. The order of application of the stresses and conditions for the change from one step to the next have been chosen to accelerate and amplify degradation mechanisms of the same type as those observed under natural climatic conditions.
| DocumentType |
Standard
|
| Pages |
13
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60068-2-61:1991 | Identical |
Reaffirmed 2016
| JIS C 60068-2-13:1989 | Basic environmental testing procedures Part 2: Tests, Test M: Low air pressure Part 2: Tests, Test M: Low air pressure |
| JIS C 60068-3-1:1995 | Background information, Section One -- Cold and dry heat tests |
| JIS C 60068-2-28:1993 | Environmental testing, Part 2: Tests -- Guidance for damp heat tests Part 2: Tests - Guidance for damp heat tests |
| JIS C 60068-1:1993 | Environmental testing Part 1: General and guidance Part 1: General and guidance |
| JIS C 5402-11-1:2002 | Connectors for electronic equipment -- Tests and measurements -- Part 11-1: Climatic tests -- Test 11a: Climatic sequence |
| JIS C 60068-2-21:2002 | Environmental testing -- Part 2-21: Tests -- Test U: Robustness of termination and integral mounting devices Part 2-21: Tests - Test U: Robustness of termination and integral mounting devices |
| JIS C 5260-5:2000 | Potentiometers for use in electronic equipment -- Part 5: Sectional specification: Single-turn rotary low-power wirewound and non-wirewound potentiometers |
| JIS C 5260-2:2000 | Potentiometers for use in electronic equipment -- Part 2: Sectional specification: Lead-screw actuated and rotary preset potentiometers |
| JIS C 5260-4:2000 | Potentiometers for use in electronic equipment -- Part 4: Sectional specification: Single-turn rotary power potentiometers |
| JIS C 60068-2-47:2008 | Environmental testing -- Part 2-47: Tests -- Mounting of specimens for vibration, impact and similar dynamic tests Part 2-47: Tests - Mounting of specimens for vibration, impact and similar dynamic tests |
| JIS C 5260-3:2000 | Potentiometers for use in electronic equipment -- Part 3: Sectional specification: Rotary precision potentiometers |
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