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JIS C 6703:2002

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Generic specification of crystal filters

Available format(s)

Hardcopy , PDF

Superseded date

23-12-2016

Superseded by

JIS C 6703:2008

Language(s)

Japanese, English

Published date

20-07-2002

€40.77
Excluding VAT

This Standard is the generic specification of crystal filters, and specifies the test methods and general requirements for crystal filters. This is applicable for capability approval and/or qualification approval procedure(s) based on IEC Quality Assessment System for Electronic Components (IECQ).

DocumentType
Standard
Pages
0
PublisherName
Japanese Standards Association
Status
Superseded
SupersededBy
Supersedes

JIS C 60068-2-17:2001 Basic environmental testing procedures -- Part 2: Tests -- Test Q: Sealing Part 2: Tests - Test Q: Sealing
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JIS C 60068-2-21:2002 Environmental testing Part 2-21: Tests - Test U: Robustness of termination and integral mounting devices
JIS C 6701:2007 Generic specification of quartz crystal units
JIS C 60068-2-13:1989 This Japanese Industrial Standard specifies the low pressure tests performed at room temperature. Part 2: Tests, Test M: Low air pressure
JIS C 60068-2-7:1993 Basic environmental testing procedures Part 2: Tests -- Test Ga and guidance: Acceleration, steady state Part 2: Tests - Test Ga and guidance: Acceleration, steady state
JIS C 60068-2-20:1996 Basic environmental testing procedures Part 2: Tests. Test T: Soldering
JIS C 60068-1:1993 Environmental testing Part 1: General and guidance
JIS C 60068-2-45:1995 Environmental testing procedures of electronic and electrical resistance to solvents (immersion in cleaning solvents)
JIS C 60068-2-64:1997 Environmental testing Part 2: Test methods - Test Fh: Vibration, broad-band random (digital control) and guidance
JIS C 60068-2-32:1995 Environmental testing Part 2: Tests. Test Ed: Free fall
JIS C 60068-2-58:2006 Environmental Testing - Part 2: Tests - Test Td: Test Methods For Solderability, Resistance To Dissolution Of Metallization And To Soldering Heat Of Surface Mounting Devices (smd)

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