JIS C 6710:2007
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Generic specification of crystal controlled oscillators
English
20-08-2007
01-03-2022
This Standard specifies the methods of test and general requirements for quarts crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures base on IEC electronic components quality assessment system (IECQ).
| DocumentType |
Standard
|
| Pages |
79
|
| PublisherName |
Japanese Standards Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC 60679-1:1997 | Identical |
| IEC 60679-1:1997/AMD2:2003 | Identical |
| IEC 60679-1:1997/AMD1:2002 | Identical |
Reaffirmed 2017
| JIS C 0617-3:1997 | Graphical symbols for diagrams -- Part 3: Conductors and connecting devices |
| JIS C 60068-2-17:2001 | Basic environmental testing procedures -- Part 2: Tests -- Test Q: Sealing |
| JIS C 60068-2-13:1989 | Basic environmental testing procedures Part 2: Tests, Test M: Low air pressure Part 2: Tests, Test M: Low air pressure |
| JIS Z 8202-3:2000 | Quantities and units -- Part 3: Mechanics |
| JIS C 60068-2-7:1993 | Basic environmental testing procedures Part 2: Tests -- Test Ga and guidance: Acceleration, steady state |
| JIS C 60068-2-32:1995 | Environmental testing Part 2: Tests. Test Ed: Free fall Part 2: Tests. Test Ed: Free fall |
| JIS C 60068-2-52:2000 | Environmental testing -- Part 2: Tests -- Test Kb: Salt mist, cyclic (sodium chloride solution) Part 2: Tests - Test Kb: Salt mist, cyclic (sodium, chloride solution) |
| JIS C 0617-4:1997 | Graphical symbols for diagrams -- Part 4: Passive components |
| JIS C 0617-2:1997 | Graphical symbols for diagrams -- Part 2: Symbol elements, qualifying symbols and other symbols having general application Part 2: Symbol elements, qualifying symbols and other symbols having general application |
| JIS C 60068-2-20:1996 | Basic environmental testing procedures Part 2: Tests. Test T: Soldering Part 2: Tests. Test T: Soldering |
| JIS C 60068-2-21:2002 | Environmental testing -- Part 2-21: Tests -- Test U: Robustness of termination and integral mounting devices Part 2-21: Tests - Test U: Robustness of termination and integral mounting devices |
| JIS C 61000-4-3:2005 | Electromagnetic compatibility (EMC) -- Part 4-3: Testing and measurement techniques -- Radiated, radio-frequency, electromagnetic field immunity test |
| JIS C 60068-2-45:1995 | Environmental testing procedures of electronic and electrical resistance to solvents (immersion in cleaning solvents) |
| JIS C 60068-2-58:2006 | Environmental testing -- Part 2: Tests -- Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
| JIS C 60068-1:1993 | Environmental testing Part 1: General and guidance Part 1: General and guidance |
| JIS C 6185:2008 | Test methods of optical time domain reflectometer |
| JIS C 6185:1995 | Test methods of optical time domain reflectometer |
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