JIS K 0149-1:2008
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Microbeam Analysis - Scanning Electron Microscopy - Guidelines For Calibrating Image Magnification
Available format(s)
Hardcopy
Superseded date
05-05-2022
Superseded by
Language(s)
Japanese
Published date
20-02-2008
Publisher
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
Japanese Standards Association
|
| Status |
Superseded
|
| SupersededBy |
2008(R2012) [22/10/2012]
2008 [20/02/2008]
| JIS Q 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| JIS Q 0030:1997 | Terms And Definitions Used In Connection With Reference Materials |
| JIS Q 0034:2001 | General requirements for the competence of reference material producer |
| JIS Q 0035:2008 | Reference Materials - General And Statistical Principles For Certification |
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