JIS K 0149-1:2008
Withdrawn
Withdrawn
A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.
View Superseded by
Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
Published date
20-02-2008
Publisher
Withdrawn date
23-10-2025
Superseded by
Sorry this product is not available in your region.
| DocumentType |
Standard
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
| SupersededBy |
2008(R2012) [22/10/2012]2008 [20/02/2008]
| JIS Q 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| JIS Q 0030:1997 | Terms and definitions used in connection with reference materials |
| JIS Q 0034:2001 | General requirements for the competence of reference material producer |
| JIS Q 0035:2008 | Reference materials -- General and statistical principles for certification |
Summarise
Access your standards online with a subscription
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.
Sorry this product is not available in your region.